The A*STAR’s National Metrology Centre (NMC) is the national measurement institute of Singapore, dedicated to advancing measurement science for an innovative and competitive economy
NMC establishes, develops, maintains and disseminates the national measurement standards traceable to the International System of Units, providing key support to a wide spectrum of industry.
Achieving the nation’s highest level of physical measurement through close collaboration with leading national and international organisation.
With a multidisciplinary team of experienced scientists and engineers and state-of-the-art facilities, NMC provides dedicated services to industry partners to meet their specific needs.
NMC believes in working in close collaboration with industry partners, to create values for them and fuel growth for the industry.
[ E-Invitation ]
Microwave and millimetre-wave (mm-wave) technology is increasingly being used in broadband communications, radar, security imaging, biomedical diagnosis, non-destructive testing, material analysis and high-speed electronics. Correspondingly, there is a growing demand for accurate measurement at these frequencies for product design and development.
National Metrology Centre (NMC), Institute for Infocomm Research (I2R), and Nanyang Technological University (NTU) are co-organising this seminar to expound on the latest technical developments, challenges and future trends, as well as R&D activities and facilities in research institutes. Topics covered include current state of microwave and mm-wave technology, new measurement technology, metrology standards, calibration services and traceability, commercial applications and future trends. The seminar provides an excellent platform for participants to discuss technology and application issues faced by the local microwave and mm-wave community.
Current and Future RF & Millimetre-wave Research Work in VIRTUS
By Prof Boon Chirn Chye, Assistant Professor, School of Electrical and Electronic Engineering, Nanyang Technological University
VIRTUS is the integrated circuit (IC) design centre of Nanyang Technological University (NTU), jointly funded by Singapore Economic Development Board (EDB). The centre has strong support from industry, and close collaboration with leading companies and universities worldwide. VIRTUS aims to overcome the design challenges in a multi-disciplinary research environment, with a broad spectrum of knowledge and skills to develop innovative circuit techniques and system solutions that will allow low-power, low-cost integration of radio frequency circuits, analog, and mixed analog/digital, combined with advanced digital signal processors and various types of sensors and sensor networks. In this talk, the speaker will share the advancement in RF & mm-wave research in VIRTUS, and available collaboration opportunities.
Millimetre-wave and Terahertz Imaging Activities in I2R
By Dr Muhammad Faeyz Karim, Scientist, Institute for Infocomm Research, A*STAR
This presentation introduces the research activities in millimetre-wave and terahertz in I2R, in particular in the area of detection and imaging. The first part of the talk will cover the detection and imaging of corrosion and surface anomalies at 60, 94 and 300 GHz using the near-field millimetre-wave technique. The talk also covers the development of a millimetre-wave system to conduct 3D body measurements of a person without the need for removal of clothing. At 35 GHz, the millimetre-wave signal illuminates the target, penetrates the clothing and reflects off the surface of the body. The frequency-domain and time-domain information are analysed and processed to obtain the 3D image. Lastly, I2R’s research work in terahertz imaging using THz Time-Domain Spectroscopy, which is especially suitable for bio-medical applications, will be presented.
Microwave and Millimetre-wave Metrology at NMC
By Dr Shan Yueyan, Senior Metrologist, National Metrology Centre, A*STAR
As the custodian of the national measurement standards in Singapore, NMC is responsible for the establishment and maintenance of the nation’s highest metrology reference standards traceable to the International System of Units (SI). In NMC, the microwave reference standards cover the power, scattering parameter, attenuation, impedance, RF voltage and signal/pulse characteristics. NMC’s microwave standards maintain accurate values through international comparisons and are recognized by other countries. This presentation will introduce NMC’s recently developed microwave and mm-wave power calibration systems with frequency range up to 50 GHz for coaxial connection and 50–110 GHz for waveguide connection. The S-parameter measurement standards traceability and uncertainty evaluation will also be covered in the presentation.
Miniature Frequency-Scalable Reflectometers for Vector Network Analysers
By Mr Barry Smith, Business Development Manager, Measurement Division, Anritsu Corporation
In this presentation, the speaker will cover various aspects of sampler-based vector-network analysers (VNAs). The presentation will cover equivalent time sampling, SRD based and NLTL-based VNAs, and will also discuss miniature reflectometers and how they fit in or coexist with VNA architectures, with emphasis on high-frequency measurements exceeding 70 GHz.
Wide-band Measurement of Material's Complex Permittivity
By Prof Shen Zhongxiang, Associate Professor, School of Electrical and Electronic Engineering, Nanyang Technological University
This talk will begin with a brief review of existing techniques for measuring dielectric materials’ complex permittivity. After highlighting the advantages and disadvantages of the existing measurement techniques, a new measurement method of characterizing the material property over a very wide frequency range will then be presented. The new method is based on an overmoded circular cavity that exhibits many resonances that can be clearly identified and modelled. The operating principle and formulas to accurately determine the complex permittivity over a wide band are presented. Experimental examples are provided to demonstrate the accuracy and usefulness of the proposed measurement method.
Femtofarad Capacitance Measurement On Organic Thin Films Using Scanning Microwave Microscopy
By Dr Chong Boon Keat, Application Scientist and Atomic Force Microscope Specialist Nano Measurement Division, Electronic Measurement Group, Agilent Technologies
Dielectric thin films play an important role in the fabrication of smaller and faster electronic devices, but it is not easy to characterize their homogeneity and the dielectric property, and existing techniques lack the necessary lateral resolution. Scanning microwave microscopy (SMM) is a recent development in SPM technique that combines the lateral resolution of AFM and the measurement precision of microwave analysis. SMM can be used to characterize the conductivity and dielectric properties of a sample. This presentation will report the use of SMM to image self-assembled monolayers of organic molecules. A simple calibration procedure for absolute capacitance measurement will be described. With a careful calibration, SMM can detect attofarad range of small capacitance difference across an organic film.
Microwave and Millimetre-wave GaAs & GaN Device Modelling and Design at NUS
By Prof Guo Yongxin, Assistant Professor, Electrical and Computer Engineering, National University of Singapore
Although GaAs-based transistors are currently the dominating devices for high-power applications, it is expected that they will soon be replaced by GaN-based transistors which will become the key devices for future wireless communication systems and other high-frequency, high-power applications. The advantages of GaN-based transistors are high efficiency, high power density, and high thermal conductivity. The market analyst Strategy Analytics forecasts that four-fifths of the GaN wireless/RF market will use SiC by 2012, and it would not be surprising to see this material technology grabbing the entire market share in the near future. In this talk, NUS’ work on small signal and large signal modelling for GaAs devices will be introduced. Some design examples on Ku-band and Ka-band power amplifiers will be demonstrated. Recent work on GaN on SiC will also be reported.
Precision Measurement of Attenuation at Microwave, Millimeter-wave and Submillimeter-wave Frequencies
By Mr Thomas Wu, Metrologist, National Metrology Centre, A*STAR
NMC has developed microwave attenuation measurement standards comprising of a single channel and a dual channel measurement system to cover the frequency range from 10 MHz to 26.5 GHz. The expanded measurement uncertainty (k=2) is estimated to be 0.0038 – 0.028 dB for a 0.01–110 dB variable attenuator at frequencies up to 26.5 GHz. NMC’s millimetre-wave and submillimetre-wave attenuation measurement standards from 40 GHz to 500 GHz will also be presented. These attenuation standards are traceable to an inductive voltage ratio standard at 5 kHz. A coaxial or waveguide step attenuator calibrated by NMC’s attenuation measurement systems can serve as an attenuation transfer standard for linearity calibration of equipment such as vector network analyzers, signal generators, spectrum analysers and power meters.
Latest Measurement Tools at Microwave and Terahertz Frequencies
By Mr Alvin Ding, Senior Sales Account Manager, ASEAN & India, Advantest (Singapore) Pte Ltd
Interference in wireless, satellite monitoring, radiation, EMI and multipath propagation presents unprecedented measurement challenges. This presentation offers better understanding of the challenges faced by engineers as microwave technologies matured and evolved. It also offers a new approach to analyse transient phenomena, modulating waves, and EMC noises by vector operation and phase synchronization. The second part of the presentation will introduce the latest imaging analysis system which exploits the unique properties of terahertz waves. These systems provide an entirely new analytic solution which enables non-destructive, 2D and 3D analysis of internal composition and structure of measurement targets.
Prof Boon Chirn Chye, Assistant Professor, School of Electrical and Electronic Engineering, Nanyang Technological University
Professor Boon Chirn Chye (M’09-SM’10) received his BE (Hons) (Elect) in 2000 and PhD (Elect Eng) in 2004 from Nanyang Technological University (NTU), Singapore. In 2005, he joined NTU as a Research Fellow and became an Assistant Professor in the same year. He specializes in the areas of radio frequency (RF) & mm-wave circuits and systems design for Biomedical and Communications applications. He has conceptualized, designed and silicon-verified 35 circuits/chips for biomedical and communication applications. He has co-authored over 54 refereed publications and several patents in the fields of RF and mm-wave, and a book “Design of CMOS RF Integrated Circuits and Systems”. He serves as a committee member for various conferences, and is an Associate Editor of the IEEE Transactions on Very Large Scale Integration (VLSI) Systems, Guest Editor for Journal of Electrical and Computer Engineering, and in the Editorial Board for Journal on RF and Microwave Computer-Aided Engineering. Prof Boon is the Programme Director for RF and mm-wave research in the S$50 million research centre of excellence, VIRTUS (NTU) since March 2010. He is also one of the key NTU-team members of MIT-NTU joint collaboration project “Low Energy Electronic Systems” which has won the Singapore-MIT Alliance for Research and Technology (SMART) International Research Grant (IRG) proposal with a grant total of S$25 million.
Dr Muhammad Faeyz Karim, Scientist, Institute for Infocomm Research, A*STAR
Dr Muhammad Faeyz Karim received the BEng degree from the National University of Sciences and Technology (NUST), Islamabad, Pakistan in 2000, and the MSc and PhD degrees from Nanyang Technological University (NTU) in 2003 and 2008 respectively. He is currently with the Institute for Infocomm Research (I2R), A*STAR, and is also an Adjunct Assistant Professor with the National University of Singapore (NUS). Before joining I2R, he was a Senior Test Engineer with Emerson Process Management, where he was involved in the development of wireless automated test equipment. From 2002 to 2005, he was with the DSO National Laboratories where he developed the RF micro-electromechanical systems (MEMS) devices for satellite communications. He co-authored RF MEMS Switches and Integrated Switching Circuits.
Dr Shan Yueyan, Senior Metrologist, National Metrology Centre, A*STAR
Dr Shan joined National Metrology Centre in 1998. She has contributed to the setup and development of national measurement standards of RF, microwave and millimetre-wave, such as power, scattering parameters, attenuation, impedance, RF voltage and signal and pulse characteristics. Currently, Dr Shan is developing the millimetre-wave power sensor calibration system and the scattering parameter measurement technology. Dr Shan is recently nominated as the RF Working Group Chair of Asia Pacific Metrology Program Technical Committee on Electricity and Magnetism CMC Review Board 2011. She has been invited as a technical assessor to peer review the calibration and measurement capabilities (CMCs) of other national metrology institutes. Dr Shan is currently the Senior Metrologist and Lab Lead of RF & Microwave Lab in National Metrology Centre.
Mr Barry Smith, Business Development Manager, Measurement Division, Anritsu Corporation
Mr Barry Smith is a Business Development Manager for the Microwave Measurement Division of Anritsu Corporation. He has worked for Wiltron/Anritsu for more than 30 years and has been in the RF and Microwave field for all of his career, starting in the Royal Navy.
Prof Shen Zhongxiang, Associate Professor, School of Electrical and Electronic Engineering, Nanyang Technological University
Prof Shen received his BEng from the University of Electronic Science and Technology of China, Chengdu in 1987; MS from Southeast University, Nanjing, China in 1990; and PhD from the University of Waterloo, Canada in 1997, all in electrical engineering. From 1990 to 1994, he was with Nanjing University of Aeronautics and Astronautics, China. He was with Com Dev Ltd., Cambridge, Canada, as an Advanced Member of Technical Staff in 1997, and with the Gordon McKay Laboratory, Harvard University, and the Radiation Laboratory, University of Michigan, Ann Arbor, in 1998 as Postdoctoral Fellow. In 1999, he joined Nanyang Technological University, and is presently an Associate Professor in the School of Electrical and Electronic Engineering. His research interests include design of small and planar antennas for various wireless communication systems, design of thin absorbing layers, hybrid numerical techniques for modelling RF/microwave components and antennas. He has authored or co-authored about 200 journal and conference papers.
Dr Chong Boon Keat, Application Scientist and Atomic Force Microscope Specialist,
Nano Measurement Division, Electronic Measurement Group, Agilent Technologies
Dr Chong Boon Keat is an application scientist in the Nanotechnologies Measurement Organization (NMO), Electronic Measurements Group (EMG) in Agilent Technologies. NMO is the global leading provider of atomic force microscope, electron microscope nano indentation and positioning product and solutions for the industrial and academic R&D markets. NMO has operations in Europe, US, Canada, Latin America, Asia and the Middle East. Dr Chong joined Agilent in 2010 and heads the NMO operations in Penang, Malaysia. He has more than 10 years of technical experience in nanotechnology, in the areas of nano measurement, instrumentation, fabrication and electronics, and has obtained several patents in nano devices, solid state storage and electronics. He has held diverse roles in R&D and high-tech manufacturing operations and has served as a senior scientist at internationally renowned research laboratories. Dr Chong holds a bachelor's degree with honours in electrical and electronics engineering and a PhD in nano electronics engineering from Glasgow University, Scotland, U.K.
Prof Guo Yongxin, Assistant Professor, Electrical and Computer Engineering, National University of Singapore
Prof Guo Yongxin joined the Department of Electrical and Computer Engineering, National University of Singapore (NUS), as an Assistant Professor in February 2009. He received his PhD from City University of Hong Kong in electronic engineering in 2001. From 2004 to 2009, he was an adjunct Assistant/Associate Professor of NUS. From 2001 to 2009, he was with the Institute for Infocomm Research as a Research Scientist. He has authored or co-authored 92 international journal papers and 110 international conference papers, and holds a Chinese Patent and a U.S. patent. His current research interests include microstrip antennas for wireless communications, implantable/wearable antennas, silicon-based on-chip antennas, low-temperature co-fired ceramics-based system-on-package technology and antenna in package, MMIC modelling and design, and RF energy harvesting for smart grids. Dr Guo has also been in the Editorial Boards of the International Journal of RF and Microwave Computer-Aided Engineering, and International Journal of Microwave Science and Technology. He was a recipient of the Young Investigator Award 2009 from NUS.
Mr Thomas Wu, Metrologist, National Metrology Centre, A*STAR
Mr Thomas Wu is a metrologist at the National Metrology Center (NMC), A*STAR. He has been working on microwave and millimetre-wave attenuation, power and S-parameter measurement system since 2005. His interests include research and development on microwave, mm-wave and submm-wave metrology. He had worked on space electronics, wireless communications, RF measurement and radar systems design prior to joining NMC. He obtained his BS and MS in Electrical Engineering from Shandong University, in 1992 and 1994, and MEng in Electrical and Electronics Engineering from Nanyang Technological University in 1999. He has given invited technical talks at the Agilent Asia-Pacific Metrology Workshop in 2007, the China Metrology and Measurement Conference in 2008 and the THz Science and Technology Workshop in 2008.
Mr Alvin Ding, Senior Sales Account Manager, ASEAN & India, Advantest (Singapore) Pte. Ltd.
Mr Alvin Ding has years of experience in the test & measurement industry, with an extensive knowledge and focus on latest and emerging technology such as high speed serial data, RF, microwave and terahertz. He has provided technical consultations to many customers in the region and given presentations in many seminars, forums and talks. Mr Ding received his Bachelor’s degree (with honours) in Electrical & Electronic Engineering from Nanyang Technological University. He is the recipient of the prestigious EEE Excellence award for his outstanding contributions and excellence in academic performance.
National Metrology Centre
1 Science Park Drive
T: +65 6279 1900
F: +65 6279 1992/1993
Enter your email address below to receive the latest updates.
National Metrology Centre A*STAR © 2015 All Rights Reserved.