Events

Seminar on Advanced Inspection, Metrology, Simulation and Characterisation for Solar Cell Manufacturing Industry

Date: 15 Oct 2010 - 15 Oct 2010

Venue: SIMTech Auditorium, Tower Block, Level 3

Introduction
This seminar will provide an excellent forum for participants to interact and share ideas as well as to gain a broader understanding of the solar manufacturing industry in terms of market trends and inspection requirements illustrated by the key industry players in Singapore, Europe and  USA. Technology leaders from industry cluster, academic and the research communities will be speaking on emerging topics.

Abstracts
Eletroluminescence imaging and analysis for solar cell measurements by Mr Christopher Chong, Radiant Optronics 
Electroluminescence is the emission of photons from a solar cell under an applied forward bias. Measuring the photographic electroluminescence of a photovoltaic device provides valuable spatially-resolved details about efficiency-degrading mechanisms in the cell, array, or panel. An integrated solution designed specifically for solar applications is provided for both quantitative and relative values of various parameters of the device for all configurations: cells, strings, and large-area panels.

14.2kWp Grid-Connected Photovoltaic System at Solar Technology Centre by Dr Tey Leong Hua, Ngee Ann Polytechnic, Singapore
In this presentation, Dr Tey will share with the participants, Ngee Ann Polytechnic's experience of setting up the 14.2kWp grid-connected photovoltaic (PV) system and the monitoring the PV system performance.

Design and Simulation for Solar Cells by Dr Martin Ang, IHPC, A*STAR
Dr Ang will introduce the design and simulation activities of photovoltaic at Institute of High Performance Computing (IHPC). This R & D institute has been participating in industrial projects for organic solar cells, solar concentrator, optical structures for thin-film solar cells, and recently anti-reflection structures for photovoltaic and displays by nanoimprinting.  

Resonance ultrasonic vibrations for crack detection in photovoltaic silicon wafers  by Dr S Ostapenko, Ultrasonic Technologies, Inc, USA
The Resonance Ultrasonic Vibrations (RUV) technique was developed for off-line and in-line non-destructive crack detection in full-size silicon wafers and solar cells. The RUV methodology relies on deviation of the resonance frequency response curve measured on a wafer with peripheral or bulk millimeter-length crack and on identical non-cracked wafers. The RUV technology allows (1) rejection of mechanically unstable Si wafers after ingot cutting before they are introduced into further cell processing; (2) identification of wafers with mechanical defects (such as cracks) during production to avoid their in-line breakage; (3) detection of cracked cells before they will be laminated into modules to avoid panel efficiency reduction and product return from the field; (4) identify cells with sub-millimeter size pin-holes. RUV system also serves as a process control tool to increase yield by eliminating production flaws caused by mechanical defects.

Inspection and Measurement for Solar Cell Manufacturingby Dr Xu Jian, SIMTech, A*STAR
To address inspection and measurement issues in solar manufacturing, multimodal sensors can be applied. CCD sensor is employed for wafer geometry, surface defect, and edge defect inspection. Short wavelength IR camera can be used for electroluminescence and photoluminescence inspection of solar internal defects. X-ray imaging and ultrasonic sensor can reveal micro-cracks. On the other hand, advanced image processing technologies such as localised camera calibration, sub-pixeling measurement, superresolution and dynamic thresholding can contribute to the traceable measurements of solar defects.

About the Speakers
Mr Paul Hjemas holds an MSc in Material Science from Norwegian University of Science and Technology (NTNU). From 2003 to 2007, Mr Hjemas was working in the REC Wafer plant in Glomfjord holding the position as Assistant Production Manager and Technical Customer Support. He has been responsible for technical cooperation and continuous product optimisation together with REC Wafer’s customers and driven projects with focus on process optimisation. From 2007 to 2009, Mr Hjemas was relocated to Heroya and joined the Technology team in REC Wafer working as a Senior Technologist in the product development group. His main responsibility include the development of characterisation techniques and projects at our key-customers with the focus on wafer quality. From 2009 Mr Hjemas was tasked to develop and build REC Wafer technology group in Singapore, and currently holding the position as R&D Director REC Wafer Singapore.

 
Mr Christopher Cheong is currently the Director of Radiant Optronics. 

 

Dr Tey Leong Hua is a module leader for “Design and Operation of Photovoltaic Systems” in Electrical Engineering of Ngee Ann Polytechnic. He is involved in several photovoltaic system projects including the funded projects by national research foundation and ministry of national development. His experience includes, but not limited to, the technical design, development and analysis of photovoltaic systems, consultancy projects on photovoltaic systems in Singapore, power quality monitoring and analysis for photovoltaic system. 

 

Dr Martin Angis a Senior Research Engineer at Institute of High Performance Computing, A*STAR. He has been working on lightwave devices for the past 13 years. Recently, he has been more involved in industrial photovoltaic projects such as nanostructures for thin film photovoltaic, optics for solar concentrator and anti-reflection structures by nanoimprinting.

 

Dr Bram Hoex is the Head of PV Characterisation Laboratory at Solar Energy Research Institute in Singapore.

Dr S Ostapenko is the Chief Executive Officer, Ultrasonic Technologies, Inc, USA

Dr Xu Jian is research scientist at Precision Measurements Group SIMTech. He has many years of experience in developing image processing solutions for wafer inspection, 3D wire bond inspection, camera calibration for precision measurements. 

Programme
1.00pm     Registration & Networking
1.30pm     Welcome Address
1.45pm     Solar Manufacturing Industry: Market Trend and Inspection
                 Requirements by Mr Paul Hjemas, REC Wafer Singapore
2.15pm     Eletroluminescence Imaging and Analysis for Solar Cell
                Measurements by Mr Christopher  Chong, Radiant Optronics
2.45pm    14.2kWp Grid-Connected Photovoltaic System at Solar Technology
                 Centre by Dr Tey Leong Hua, Ngee Ann Polytechnic, Singapore
3.15pm     Design and Simulation for Solar Cells by Dr Martin Ang, IHPC, A*STAR
3.30pm     Tea break & Networking
4.00pm     Silicon Wafer Solar Cell Characterisation at SERIS by Dr Bram Hoex,
                 SERIS, Singapore
4.30pm     Resonance Ultrasonic Vibrations for Crack Detection in Photovoltaic
                Silicon Wafers by Dr S Ostapenko, Ultrasonic Technologies, Inc           
5.00am    Inspection and Measurement for Solar Cell Manufacturing
                by Dr Xu Jian, SIMTech, A*STAR
5.30pm    End of Seminar

Who Should Attend
SIMTech SMS & PE COI members, precision engineering and technical staff, R&D Managers involved in the areas of solar manufacturing, inspection equipment manufacturing, system integration and quality assurance. Academic staff and students interested in exploring the challenges and solutions in solar cell inspection, measurements and characterisation of silicon wafer solar cell are also invited to attend.

Registration
This seminar is free of charge. Seats are available on a first-come, first-served basis. Please register online.

Contact Us
For technical enquiries: Dr Xu Jian, Email: jxu@SIMTech.a-star.edu.sg

For general enquiries: Alice Koh, Email: kohth@SCEI.a-star.edu.sg