Seminar: X-ray CT System Development & CT Inspection for Industrial Applications

Date: 20 Jul 2009 - 20 Jul 2009

Venue: SIMTech Auditorium, Level 3, Tower Block

The seminar is focused on the latest X-ray CT (Computed Tomography) technologies in industrial CT system development, CT metrology, CT image processing and CT applications in aerospace, precision engineering, electronics and biomedical industries. These technologies play an important role in inspecting, measuring and modelling internal structures for product development, quality assurance, and failure analysis.



Refreshment and Registration

Morning Session – CT System Development and CT Metrology
Chaired by Dr Xu Jian, SIMTech




*Dr Randolf Hanke, Fraunhofer-IIS, Germany
“State of the Art and Future in Threedimensional Radioscopy”
* Dr D Weiss, Carl Zeiss, Germany
“Calibration and Correction Methods for X-Ray CT-Based Metrology and
Inspection of Industrial Parts”




CT Technologies and System Development
* ProfessorUwe Ewert, BAM, Germany
“Mobile- X-Ray Computed Tomography of Large Components in Aerospace
Industry and of Welded Pipes”
* Dr Masayuki Kamegawa, Shimadzu, Japan
“The Latest Developments in Shimadzu Microfocus X-Ray CT”
* Dr Liu Tong, SIMTech
*Planar Cone-Beam CT Reconstruction for High-Resolution Industrial
* Dr Andrew Malcolm, SIMTech
“Affordable Computed Tomography Solutions”


Lunch and Networking

Afternoon Session – CT Image Processing and CT Applications
Chaired by Mr Gerhard Schick, Carl Zeiss GmbH


Professor Uwe Ewert, BAM, Germany
“Computed Tomography at BAM – From Nano-Scale to High Energy Technique”












CT Image Processing & CT Industrial Applications
* Dr Randolf Hanke, Fraunhofer-IIS, Germany
“Computed Tomography – A New Opportunity to Measure Complete Volumes”

* Dr Wang Xin, University Tunku Abdul Rahman, Malaysia
“Computer-aided Defect Detection for Non-destructive Testing Using
Machine Vision”

* Mr Akiyama, Saki Corporation
“Hi-Speed 3D X-ray In-Line Inspection System for Printed Circuit Board

Refreshments& Networking

* Mr G Schick, Carl Zeiss
“Applications of Metrology CT for the PE Industry”

* Mr Dennis Maier, Asia Pacific Volume Graphics GmbH,
“Industrial CT & VGStudio MAX – The Universal Inspection Tool”

* Dr Xu Jian, SIMTech
“CT Image Processing for Semiconductor Devices: Automatic Layer
Separation, 3D Wire Loop Tracing and Leadframe Warpage Inspection”


End of the Seminar

Who Should Attend
Managers and engineers from industry,academic and researchers from universities and research institutes.

Online Registration
Pre-registration for the seminar is necessary. Seats are available on a first-come, first-served basis. As seats available are limited, do register early to avoid disappointment. Please click here for the brochure.

Registration Fee (Inclusive of 7% GST) 

Seminar (20 July '09)

SMS Member: $80.00 per participant
Non-SMS Member: $100.00 per participant

Tutorial (21 July '09)

SMS Member: $120.00 per participant
Non-SMS Member: $150 per participant
Please click here for details of the tutorial programme

Seminar & Tutorial

SMS Member: $180.00 per participant
Non-SMS Member: $225.00 per participant

Visit to Nanyang Polytechnic (21 July '09)with Demonstration

No Charge for visit to NYP where Carl Zeiss has a metrotom CT system installed and operational. Attendees are encouraged to bring samples for scanning. The overseas speakers will be available to discuss potential applications with individual attendees.

All cheques/bank drafts should be made payable to "Singapore Institute of Manufacturing Technology" crossed and marked "A/C payee only.

For technical enquiries:  Dr Xu Jian, Email:; Tel: 9151 5317 / 6793 8307  

For general enquiries: Alice Koh, Email:; Tel: 67938249