Researcher Portfolio

Yin Xiaoming (Dr)
Senior Research Engineer III
6319 4496
Precision Measurements
Introduction:Xiaoming YIN received her Ph.D. degree on Computer Vision from Nanyang Technological University, Singapore in 2002. Since 2001, she has been working with Singapore Institute of Manufacturing Technology as a research engineer.
Research Interest:Image processing, Defect inspection
BioNotes:

PhD, Nanyang Technology University, Singapore, 2002,

M. Eng., Zhejiang University, P. R. China, 1998

B. Eng., Zhejiang University, P. R. China, 1993

Publications:
  1. X. M. Yin, “Automatic crack & corrosion detection methods for drone based structure inspection”, Technology Disclosure, Sep 2016.

  2. X. M. Yin and J. Xu, “Auto learning and recipe free inspection method for automated optical wire bond inspection”, Technology Disclosure, Nov 2015.

  3. X. M. Yin, T. Y. Jiang and J. Xu3D Visualization and image processing software”, Technology Disclosure, Mar 2015.

  4. X. M. Yin, “Subsurface Defect Inspection with Differential Temperature Distribution Profile Reconstruction”, Trade Secret, Mar 2012.

  5. X. M. Yin and W. K. Chong, “Noise-Resilient Method for Coherence Peak Sensing of White Light Interferometry”, Trade Secret, Jun 2011.

  6. X. M. Yin, L. P. Zhao, X. Li and Z. P. Fang, "Online Surface Measurement with Digital Shack-Hartmann Wavefront Sensor", International Journal of Nanoscience, Vol.9, No.2, pp.1-10, Apr 2010.

  7. X. M. Yin, L. P. Zhao, X. Li and Z. P. Fang, "Automatic Centroid Detection and Surface Measurement with Digital Shack-Hartmann Wavefront Sensor", Measurement Science and Technology, Vol.21, No.1, pp.15304-15320, Jan 2010.

  8. X. M. Yin, X. Li, L. P. Zhao and Z. P. Fang, "Adaptive thresholding and dynamic windowing method for automatic centroid detection of digital Shack-Hartmann wavefront sensor ", Applied Optics, Vol.48, No.32, pp.6088-6098, Nov 2009.

  9. X. M. Yin and Z. P. Fang, "Vision-Based Automatic needle inspection system for safety lancets”, in Proceedings of 3rd IEEE Conference on Industrial Electronics and Applications, Singapore, Jun 3 – 5, 2008.

  10. X. M. Yin, S. H. Wang and I. Reading, “Vision-Based Automatic Endface Inspection of Single Fiber Optical Connectors”, Measurement Science and Technology, Vol. 16, p966 – 976, Mar 2005.

Awards:Licensing Award, SIMTech, 2016
Licensing Award, SIMTech, 2014
Licensing Award, SIMTech, 2011
Licensing Award, SIMTech, 2010
The Best Industrial Project Award, SIMTech, 2009
The Best Industrial Project Award, SIMTech, 2004