Researcher Portfolio

Ng Boon Ping (Dr)
Scientist III
6319 4491
Precision Measurements
Introduction:

NG Boon Ping received his B. Eng. and Ph.D. degrees from the School of Electrical and Electronic Engineering, Nanyang Technological University (NTU), Singapore, in 2004 and 2009 respectively. He joined the optics team in Singapore Institute of Manufacturing Technology (SIMTech), Agency for Science Technology and Research (A*STAR). He joined the optics team in Singapore Institute of Manufacturing Technology (SIMTech), Agency for Science Technology and Research (A*STAR) upon graduation. From 2011 until 2013, he worked as a Guest researcher in NIST, USA and PTB, Germany. He returned to SIMTech since 2014.

Research Interest:

Nanometric Measurements, Near-field Optical Microscopy, Weak Signal Detection and optics design

BioNotes:

Ph.D., Nanyang Technological University, Singapore, 2009
B.Eng., Nanyang Technological University, Singapore, 2004

Publications:
  1. R Dixson, BP Ng, X Bonnaud, N Orji, “Interactions of higher order tip effects in critical dimension-AFM linewidth metrology,” J. of Vacuum Science & Technology B 33 (3), 031806, 2015.

  2. R Dixson, B.P. Ng, N Orji, “Effects of lateral tip control in CD-AFM width metrology”, Measurement Science and Technology, vol. 25, pp. 094003, 2014.

  3. Z Liu, Y Zhang, SW Kok, BP Ng, YC Soh, “Reflection-based near-field ellipsometry for thin film characterization,” Ultramicroscopy , vol. 124, pp. 26-34, 2013.

  4. Z. Liu, Y. Zhang, S. W. Kok, B. P. Ng and Y. C. Soh, “Artifacts removal by intrinsic harmonics of tuning fork probe for scanning near-field optical microscopy“ , Applied Physics Letter, vol. 97, pp. 1931081-1931083, 2010.

  5. Z. Dong, Y. Zhang, S. W. Kok, B. P. Ng and Y. C. Soh, “Shear-force atomic force microscopy by using the second resonance regime of tuning fork probe”, Optics Express, vol. 18, pp. 22047-22060, 2010.

  6. Z Liu, Y Zhang, S. W. Kok, B. P. Ng, Y. C. Soh, “Near-field ellipsometry for thin film characterization”, Optics Express, vol. 18, pp. 3298-3310, 2010.

  7. B. P. Ng, Y. Zhang, S. W. Kok, and Y. C. Soh, “Improve performance of scanning probe microscopy by balancing tuning fork prongs”, Ultramicroscopy, vol.109, pp.291, 2009.

  8. B. P. Ng, Y. Zhang, S. W. Kok, and Y. C. Soh, “An improved dynamic model of tuning fork probe for scanning probe microscopy”, Journal of Microscopy, vol. 234, pp.191, 2009.

  9. B. P. Ng, H. L. Seck, Y. Zhang, and Y. C. Soh, “Optical Detection using Multi-wavelength Modulation”, Key Engineering Materials, vol.381, pp.325-328, 2008.

  10.  B. P. Ng, Y. Zhang, and Y. C. Soh, “Phase locked-in loop design with pre-specified transient performance”, Proceedings of SPIE, vol.5907, art. no.59070U, pp.1-8, 2005.