Introduction:Dr. Wang Zhongke is a research scientist in SIMTech since November in 2007. He specializes in laser micro- and nano-processing. Before joining SIMTech, he was with AIST as a JSPS Fellow in Japan, ETH-Zurich as a Simon Fellow in Switzerland and REKIN as a contract researcher in Japan, from 2001 to 2007. He studied in three different universities in China. He has published over 80 scientific papers (including conference proceedings), two book chapters (in USA and in UK respectively), and a number of patents including in China, Japan, Singapore and international.
Research Interest:Laser micro- and nano- machining and fabrication of materials from brittle glasses, crystal, silicon, ceramics, metal to soft polymers.
BioNotes:1994-1998: PhD in MSE, Huazhong University of Science and Technology
1992-1994: MSE, Inner Mongolia University of Technology
1987-1992: MSE, Shenyang University of Technology
Publications:Z.K. Wang, H.Y. Zheng; Investigation on CO2 laser irradiation inducing glass strip peeling for microchannel formation, Biomicrofluidics, 6(1), 012820 (2012)
Z.K. Wang, H.Y. Zheng, H.M. Xia; Femtosecond laser-induced modification in surface wettability of PMMA for fluid separation in microchannels; Microfluidics and Nanofluidics 10, 225 (2011)
Z.K. Wang, H.Y. Zheng, C.P. Lim, Y.C. Lam; Polymer hydrophilicity and hydrophobicity induced by femtosecond laser direct irradiation; Applied physics letters 95, 111110 (2009)
Z.K. Wang, K. Sugioka, K. Midorikawa; Fabrication of integrated microchip for optical sensing by femtosecond laser direct writing of Foturan glass, Applied Physics A 93, 225(2008)
Z.K Wang, K. Sugioka, Y. Hanada, K. Midorikawa; 3D integration of microoptical components buried inside photosensitive glass by femtosecond laser direct writing, Applied Physics A, 89, 951 (2007),
Z.K. Wang, B. Hattendorf, D. Günther; Vaporization and Ionization of Laser Ablation generated Aerosols in an Inductively Coupled Plasma Mass Spectrometer - Implications from Ion Distribution Maps, Journal of Analytical Atomic Spectrometry. 21, 1143 (2006)