Key R&D Areas

DSI also conducts tester development for NVM with the capabilities on electrical parametric, memory function and reliability testing. High frequency tester was developed with shortest pulse width of 200 picoseconds. Both cell and array testers were developed with fast rewrite testing of 1E8 overwrite cycles in 6 minutes.

Fig. 1 PS-testing platform comprising PCB circuit, high frequency & resolution equipments, software & interface