Scanning Electron Microscope (JSM-6701F)
The JSM-6701F is a high-resolution (1.0 nm) field emission microscope with semi in-lens detector. Observation of fine surface structures of delicate specimens is enabled by using very low accelerating voltages while the optional STEM (Scanning Transmission Electron Microscope) mode can reveal the internal structures of a thin specimen using high accelerating voltage. The unique conical cold FEG of the JSM-6701F allows change of the accelerating voltage directly from the operation menu. Non-conductive specimens can be observed without a conductive coating and alignment is automatically adjusted.
Scanning Electron Microscope (JSM-6390LV)
The JSM-6390LV is a high-performance scanning electron microscope with a resolution of 3.0 nm. The low vacuum mode allows for observation of specimens that cannot be viewed at high vacuum due to excessive water content or because of a non-conductive surface. The JSM-6390LV is easy to operate and provides user versatility for many research and diagnostic applications.
Transmission Electron Microscope (JEM2200FS)
The analytical JEM-2200FS TEM (point resolution 0.19 nm) combines a 200 kV field emission gun and an in-column energy Omega Filter to produce a high-end, optimally configured TEM for energy filtered imaging and for chemical analysis of specimens. The JEM-2200FS utilizes rotation-free image-forming optical system that facilitates acquisition of TEM images and diffraction patterns and produces stable spectra data. The microscope is equipped with Jeol 64-bit 3D-tomography system with high-tilt specimen retainer, TEMography software for data reconstruction and visualization, Gatan cryo system and ultra-low noise TVIPS TemCam-F416 CMOS camera (16bit, 4k).
Transmission Electron Microscope (JEM-1010)
The JEM-1010 (100 kV) is a compact, high performance TEM with high contrast objective lens pole piece combining the highest possible contrast and brightness with optimum resolution (0.45 nm) for life science studies. The JEOL cool beam gun allows high-brightness, high coherence illumination conditions with low emission current. Microscope is equipped with bottom-mount SIA model 12C high resolution full-frame CCD camera (16bit, 4K).
Leica EM HPM100
High pressure freezing system for vitrifying samples up to 200 µm in thickness uses 3 mm or 6 mm diameter carrier system for vitrification of cells grown on sapphire discs or in suspension. Also processes other biological or synthetic material (e.g. emulsions) using carrier system or copper tubes. The state-of-the-art design of the Leica EM HPM100 enables express sample handling and easy use with excellent freezing results. (Source: www.leica-microsystems.com/products/em-sample-prep/
Leica EM AFS2 FSP
Freeze Substitution and Low Temperature Embedding System for Light and Electron Microscopy. The Leica EM AFS2 performs freeze substitution and progressive lowering of temperature (PLT) techniques and allows low temperature embedding and polymerization of resins. The Leica EM FSP (freeze substitution processor) is an automatic reagent handling system combined with the Leica EM AFS2, dispenses reagents for both freeze substitution and PLT applications. The LED illumination from within the chamber and the attached stereomicroscope for viewing and positioning of samples ensures ease of use. (Source: www.leica-microsystems.com/products/em-sample-prep/
Leica EM GP
Automated plunge freezing device for the preparation of vitrified fluid samples or extremely thin samples for cryo-TEM, including biological suspensions and industrial emulsions in both, aqueous and inorganic solvents. The Leica EM GP plunge freezes samples into liquid ethane after removing excess fluid by automatic blotting. The EM GP can be used to plunge freeze samples not only on EM grids, but also sapphire discs and samples in freeze fracture planchettes. (Source: www.leica-microsystems.com/products/em-sample-prep/
Leica EM BAF060
High-end sample preparation system for freeze fracturing, etching and freeze drying of double replica, high resolution carbon/metal mix coatings for TEM and SEM analysis. The Leica EM BAF060 features an advanced microtome, flexible shadowing options with two independent electron beam sources and a load-lock transfer system. (Source: www.leica-microsystems.com/products/em-sample-prep/
Leica Ultracut EM UC7 with Leica IC80 HD camera
Leica Ultracut EM UC7 with Leica EM FC7Cryo chamber
Leica Ultracut UCT
Leica Ultracut E
Thermo Scientific Microtome HM 650 V (vibration microtome)
Leica EM CPD030 Critical Point Drying device for controlled specimen dehydration
Leica EM SCD050 Cool sputtering device with CEA 035 carbon evaporation supply
Leica EM QSG100 Quartz Crystal Film Thickness Monitor
Leica EM SCD005 Glow discharge device
Zeiss Axiovert 40CFL inverted microscope
Leica M205C High performance stereo microscope
Leica MZ125 Stereo microscope
Leica WILD M8 Stereo microscope
Motic BA310 microscope with Moticam 580INT camera