Personal Details

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Dr. LEONG Hai Sheng

Scientist I


Nanofabrication (NFB) Department


2 Fusionopolis Way Innovis #08-03 Singapore 138634

Research Details

  • Non-destructive testing optical methods for material characterization

  • Nanophotonics

  • Optical characterization of materials

  • Optical system and device design and modelling

  • Development of Enhancement Techniques for 3D Structured Light Inspection

  • Non-destructive measurement of paint thickness on composite aircraft

  • Scientist, ASTAR

  • Optical engineer, Broadcom (Penang, Msia)

  • Graduate Research Assistant, UAHuntsville

  • BSc Electrical Engineering, Michigan Technological University

  • MSc Electrical Engineering, UAHuntsville

  • PhD Eectrical Engineering, UAHuntsville

  • Outstanding UAHuntsville Electrical Engineering Graduate Student Award

  • Outstanding UAHuntsville Graduate Student Paper Award

  • Ambassador Scholarship, Michigan Technological University

  1. Kun Huang, Jie Deng, Hai Sheng Leong, Sherry Lee Koon Yap, Ren Bin Yang, Jinghua Teng and Hong Liu, “Ultraviolet Metasurfaces of ~80% Efficiency with Antiferromagnetic Resonances for Optical Vectorial Anti-Counterfeiting,” accepted for publication in Laser Photonics Review 

  2. Junpeng Guo and Hai-Sheng Leong, “Mode splitting of surface plasmon resonance in super-period metal nanohole array gratings,” Appl. Phys. Lett. 101, 241115, 2012

  3. Hai-Sheng Leong and Junpeng Guo, “A surface plasmon resonance spectrometer sensor using a super-period metal nanohole array grating,” Opt. Exp. vol. 20, no. 19, pp. 21318-21323, 2012 

  4. Junpeng Guo and Haisheng Leong, "Investigation of surface plasmon resonance in super-period gold nanoslit arrays," J. of the Optical Society of America B, vol. 29, no. 7, pp. 1712-1716, 2012

  5. Hai-Sheng Leong and Junpeng Guo, “Surface plasmon resonance in super-periodic metal nanoslits,” Opt. Lett. 36,pp 11-13, 2011

  6. Hai-Sheng Leong, Junpeng Guo, Robert Lindquist, and Qing H. Liu, “Surface plasmon resonance in nanostructured metal films under the Kretschmann configuration,” J. Appl. Phys. 106, pp. 124314, 2009

Leong, H., Chong, C., Wong, W., 2016. Reflective absolute encoder sensor. U.S. Patent application 15/332044

Last updated on : 04 Apr 2019 08:28 AM