18 May 2012   |   2:00 pm - 5:00 pm,   Grand Copthorne Waterfront Hotel, Singapore

World Metrology Day Conference: Metrology for Confidence in Measurement


World Metrology Day marks the founding of the Metre Convention by seventeen nations on 20 May 1875. The Convention sets the framework for global collaboration in the science of measurement and the uniformity of measurement in commercial and industrial applications.

National Metrology Centre (NMC), A*STAR, is organising a Conference on “Metrology for Confidence in Measurements” on 18 May 2012 to commemorate World Metrology Day. At the Conference, our speakers will be sharing on how to leverage on the national measurement system to gain the confidence of users, stakeholders and regulators on calibrations, measurements and testing done for global trade and industry. Topics to be discussed include: Mutual Recognition Arrangements (MRAs) for global acceptance of calibration, measurement and test results; new initiative and programmes to help laboratories upgrade their capabilities; good practices in setting up proper instrumentation, and the selection of competent calibration or testing laboratories to ensure accurate and reliable measurements; latest developments and trends in instrumentation, calibration & measurement technologies.

The seminar will be relevant to all industries which require accurate and precise measurements for product design, manufacturing and engineering services for the global markets, as well as research organisations which seek higher levels of measurement accuracy for R&D and international collaborations. The topics will be particularly beneficial to organisations seeking accreditation, certification or recognition for the quality of their systems, products and measurements.

Tentative Programme




Welcome Address
Dr Thomas Liew, Acting Executive Director, National Metrology Centre


Keynote Speech-Reliable Metrology in Evaluation Infrastructure for assuring Safety, Security and Sustainability [ Download material ]
Dr Mitsuru TANAKA,
Agency of Industrial Science and Technology (AIST), Japan


Global Recognition in Measurement [ Download material ]
Ms TAN Siew Leng, National Metrology Centre


Morning Break & Exhibition


Improving Traceability and Acceptance of  Measurements within the CIPM MRA and ILAC Arrangement [ Download material ]
Mr Jason TAN, Singapore Accreditation Council


Proficiency Testing – Confidence Building for Laboratories [ Download material ]
Mr Victor TAN, National Metrology Centre


Measurement Uncertainty – A Measure of Confidence [ Download material ]
Dr CHUA Sze Wey, National Metrology Centre


Achieving Accurate and reliable Inorganic Measurements
Dr Richard SHIN, Health Sciences Authority


Selecting Instruments & Laboratories – The Right Measures [ Download material ]
Mr Victor TAN, National Metrology Centre


Lunch & Exhibition

13:30 - 16:00

Instrumentation, Calibration &  Measurement Technology


RF Network Analyzer for field testing of multi-pair differential cabling [ Download material ]
Harshang Pandya, Managing Director, Psiber Data Pte Ltd


Automated Industrial Metrology CT Developments and Trends [ Download material ]
Lim Seng Hoo, Director, Cairnhill Metrology Group


Very Low Pressure Calibration – Why is it so difficult [ Download material ]
Karl Kurtz, Senior Product Application and Training Specialist, Fluke Calibration


Good Pipetting Practice : The Importance of Calibration, Calibrator and the Environment in Liquid Handling [ Download material ]
Simon Andrews, Market Manager - Asia Pacific, Mettler-Toledo


Afternoon Break & Exhibition


End of Conference