Events


22 Feb 2012   |   10:00 am - 11:30 am,   NMC Meeting Room, Level 2, TÜV SÜD PSB Building, 1 Science Park Drive, Singapore 118221

Seminar on RF/Microwave Research Activities at KRISS by Dr Jin-Seob KANG, Principal Research Scientist, Korea Research Institute of Standards and Science (KRISS)


Introduction

Dr KANG's presentation will cover the following:

  • Introduction to RF, microwave and millimetre wave metrology in Korea
  • Importance of dimensional traceability and uncertainty of microwave scattering parameters
  • Technologies involved in scattering parameter measurement, and antenna metrology
  • Applications of RF, microwave and millimetre wave metrology
  • New research and applications of RF, microwave and millimetre wave metrology

The seminar will help the industrial and research community understand the importance of metrology through the experiences and activities of a top national metrology institute (NMI) in RF, microwave and millimetre wave metrology. The seminar will explain the new applications of traceable scattering parameter through air line measurements. The expertise in antenna metrology will benefit the collaboration between NMIs and industry/research community in future projects.

About the presenter

Dr Jin-Seob KANG received his PhD at the Korea Advanced Institute of Science and Technology (KAIST) in 1994 and worked in several universities in Korea and United States before joining the Korea Research Institute of Standards and Science (KRISS) in 1998 as Principal Research Scientist. Dr Kang has maintained and improved measurement standards in impedance, antenna characteristics and field strength. Dr Kang piloted and participated in the international CCEM Key Comparisons and regional Asia Pacific Metrology Programme (APMP) comparisons, as well as the intercomparisons with National Institute of Standards and Technology (NIST), USA, and National Physical Laboratory (NPL), UK, in electrical field strength measurements at frequencies between 10 MHz and 1 GHz, 50 ohm coaxial mismatches, V-band (50-75 GHz) antenna gain comparison and W-band (75-110
GHz) antenna gain. Dr Kang's expertise also covers the forward and inverse scattering, microwave imaging and numerical simulations.

Who Should Attend

Senior management, researchers, scientists, engineers and technologists in the industry, research organizations and universities who deal with RF, microwave, and millimetre wave measurements in their work and R&D. Students in engineering and science, especially those in high frequency engineering and science will find the talk educational and enlightening.

Programme

10:00 a.m. Registration
10:15 a.m. Presentation by Dr Jin-Seob Kang
11:15 a.m. Q&A
11:30 a.m. End of programme