20 May 2015   |   8:30 am - 4:10 pm,   Grand Copthorne Waterfront Hotel, Singapore

World Metrology Day 2015 Conference: Measurements and Light

World Metrology Day 2015 Conference: Measurements and Light

Date: Wednesday, 20 May 2015
Venue: Grand Copthorne Waterfront Hotel, Singapore


World Metrology Day marks the founding of the Metre Convention by seventeen nations on 20 May 1875. The Convention sets the framework for global collaboration in the science of measurement and the uniformity of measurement in commercial and industrial applications.

To commemorate this day, the A*STAR National Metrology Centre (NMC) and the Health Sciences Authority (HSA) are jointly organising a Conference on “Measurements and Light” on 20 May 2015.

This year, invited speakers will share how light-related measurement science support the challenges faced by various industry sectors, which will benefit the end-users, stakeholders and regulators in related product design & development, calibration, measurement and testing that are critical for global trade and industry.  The conference programme is as follows:




Welcome Address 
Dr Thomas Liew, Executive Director, National Metrology Centre


Keynote: International Year of Light and Optical Fibre Technologies 
Professor Perry Shum, Chair, International Year of Light 2015 Singapore Committee and Chair IEEE Photonics Society Singapore Chapter


NMC Overview cum Tokens of Appreciation to Industry Partners 
Dr Beng Cheah, Director, Industry Development Office, National Metrology Centre


Morning Break & Exhibition


Light Measurement & Measurement Using Light 
Mr Huang Xuebo, Assistant Head, Optical Metrology, National Metrology Centre


Minimum Energy Performance Standards (MEPS) and Energy Labelling for General Lighting [ download ]
Mr Frankie Foo, Assistant Manager, National Environment Agency


Light for Advanced Manufacturing and Measurement 
Dr Joan Xie, General Manager, JD Union


Photonics for Gas Sensing & Applications [ download ]
Dr Alex Gu, Technical Director of MMD & SAM, Institute of Microelectronics


Approaches to Assessing the Purity of Organic Compounds 
Dr Wong Lingkai, Scientist, Chemical Metrology Laboratory, Health Sciences Authority


Lunch & Exhibition


Measurement & Instrumentation:


Laser Diagnostic Measurements and Instrumentation [ download ]
Dr Mike Khoo Yong Chuan, Regional Sales Manager, TSI Instruments Singapore Pte Ltd


Modern Non-Contact Metrology and Correlation to Stylus Metrology
Dr Mike Conroy, Business Development Manager, Taylor Hobson Ltd


Light and Material Characterization
Dr Teo Wei Boon, Molecular Spectroscopy Product Specialist, PerkinElmer Singapore Pte Ltd


The Digital Age ofl Metrology – An Update [ download ]
Mr Lim Seng Hoo, Group Managing Director, Cairnhill Metrology Pte Ltd


Understanding Uncertainty Components in Weighing
Mr Leong Kong Meng, Business Area Manager, Mettler Toledo (S) Pte Ltd


Afternoon Break & Exhibition


End of Conference

There were also exhibits showcasing a wide variety of advanced instrumentation and measurement technologies for industry sectors including biomedical, healthcare, precision engineering, pharmaceutical, and more.

The event has drawn more than 150 participants from various sectors which use accurate and precise measurements for product design, manufacturing and engineering services for the global markets; as well as research organisations which seek higher levels of measurement accuracy for R&D and international collaborations. 

For more information, you can contact Ms Cui Shan at telephone no. 6279 1912 or via email, or Ms Zhang Jing at telephone no. 6477 6722 or via email


Organised By :



In Conjunction With :


Supported By :


Industry Partners :

Platinum :


Gold :


Silver :


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