Events


15 Nov 2011   |   9:00 am - 5:30 pm,   Einstein Room, National Metrology Centre, 1 Science Park Drive, Singapore 118221 Tel.: 62791900 Fax: 62791992

Metrology Upgrading Programme - Uncertainty Evaluation for CMC Submissions of Electrical Calibrations and Tests


MUP aims to contribute to the productivity of the industry through transferring and sharing knowledge and expertise in measurement science and technology with the industry. This programme comprises metrology courses, workshops, and seminars which are held throughout the year. Technical staff and researchers who work on measurements and instrumentation in the various industrial sectors will benefit from the programme.


Course Objective
In 2009, the International Laboratory Accreditation Cooperation (ILAC) and the Regional Accreditation Cooperation Bodies changed the definition of Best Measurement Capability (BMC) to Calibration and Measurement Capability (CMC). The former has been widely adopted by laboratory accreditation schemes, and the latter by metrology organisations and national metrology institutes. This change in definition, which Singapore Accreditation Council (SAC) has adopted, requires test and calibration laboratories in Singapore to re-evaluate their claims for accreditation, in order to comply to updated standards and guidelines.


While some laboratories have updated their claims in accordance with this change, most of the local laboratories are still facing difficulties in changing their full scope of claims.


The National Metrology Centre (NMC) organised this 1-day course to facilitate the local industry to prepare for this change to CMC definitions. The course reviews the basic steps in evaluating measurement uncertainties and emphasises how to compute CMC with inclusion of the contribution from the “best existing device” under calibration. Examples will be given to enhance the understanding of uncertainty evaluation steps and to analyse mistakes often encountered in practice.


Course Instructors 
Dr Jing Tao has worked as a senior metrologist for 18 years with the National Metrology Centre after his academic career in Xi’an Jiaotong University, China, and Delft University of Technology, the Netherlands.
Besides his work in electrical metrology, he also conducts laboratory assessments and was a member of the SINGLAS working group for measurement uncertainty, and was involved in the current SINGLAS migration from BMC to CMC. Internationally he continuously performs on-site and document peer reviews for other national metrology institutes. He is a senior member of IEEE.


Course Details

  • Concepts of Uncertainty in Measurements

  • Evaluation of Uncertainty Components and Probability Distribution of Measurand

  • Law of Propagation of Uncertainties and Sensitivity Coefficients

  • Level of Confidence and Expanded Uncertainty

  • Analyses of Uncertainty Sources with Examples in Electrical Measurements

  • Other Considerations in Computing CMCs

  • Update on CMC Migration, and Efficient Submission of CMC Data


Administration Details
Due to the limited number of places, acceptance of registration will be based on a first-come-first-served basis. All successful registrants will be informed. Payment is required on registration confirmation. Crossed cheques should be made payable to “SCEI-NMC”. Payment can also be made by credit card and NETS. If a registrant is unable to attend, another candidate may replace him/her. A 50% refund will be made only for withdrawals received in writing at least five days before the commencement of the course. NMC reserves the right to cancel or postpone the course.  In the event of cancellation, registration fees will be refunded in full.