News & Article

Celebrating World Metrology Day 2015

21 May 2015

World Metrology Day marks the founding of the Metre Convention by seventeen nations on 20 May 1875, and is celebrated by over 80 countries each year on 20 May.

The A*STAR National Metrology Centre (NMC) joined the international community to commemorate this occasion with a conference ‘Measurements & Light’, a theme aligned with UNESCO International Year of Light and Light-based Technologies 2015 (IYL 2015).

Centering on this theme, NMC’s World Metrology Day event included a series of talks by invited speakers on how light-related measurement science support the challenges faced by various industry sectors. A number of NMC’s industry partners exhibited at the event and showcased a variety of advanced measurement instrumentation and technologies for industry sectors such as biomedical, healthcare, precision engineering and pharmaceutical.

Jointly organized by the Health Sciences Authority, the event saw more than 160 participants joining in the World Metrology Day celebration, where they were also updated with the latest development in measurement science and technology. The event also provided a good opportunity for the participants to network and exchange ideas and opinions with NMC’s scientists, metrologists as well as other industry delegates.

Professor Perry Shum, Chair, International Year of Light 2015 Singapore Committee and Chair, IEEE Photonics Society Singapore Chapter delivering the keynote speech

Participants viewing the exhibits displayed by industry partners

At the event, NMC’s Executive Director, Dr. Thomas Liew, congratulated and presented some 20 industry partners with the Proficiency Test (PT) Certificates for successfully completing their PTs. Dr. Liew also presented tokens of appreciation to industry partners who have supported NMC in the various PTs. 

Click here for more photos.

Download some of the presentation materials here: