Real CT measurements are prone to various effects and influences which determine the quality of image produced leading to uncertainty in measurement and unreliability in defect detection. Due to the time-consuming and expensive nature of X-ray computed tomography it is often not feasible or to conduct a sufficient range of experiments to determine properly the effect of task or equipment specific influences. Similarly, the assessment of the reliability of defect detection requires access to a significant quantity and spectrum of component samples with clearly identified and characterised defects. This is not generally practical.
Furthermore, when X-ray CT is considered as a potential inspection solution for new applications, components or task it is
difficult to assess the specifications of a suitable X-ray system that will generate useful data for subsequent analysis when issuessuch as component size, geometry and composition need to be considered against criteria such as X-ray energy, detectorperformance and sample manipulation.Even when system hardware issues have been resolved, the planning of the CT scanningprocess still needs to be addressed to create scanning parameters including X-ray settings, number of projections etc. that will generate optimal results. Providing the suitable computation performance can be achieved, simulation and modelling of the CT acquisition process offers the potential to address all of the above requirements.
During this workshop the speakers will provide detailed coverage of technical issues relating to the simulation of the
entire X-ray tomographic acquisition process and will provide training in the use of the Fraunhofer Scorpius XLab simulation system.
2.00pm Presentation :
a) Introduction to the Simulation of X-ray Physics and Computed Tomography
b) Fraunhofer Scorpius XLAB Simulation System
c) Use of Simulation for NDT Evaluation
3.45pm Coffee Break
4.15pm Hands-on Session using Scorpius XLAB
Scorpius XLab® Features :
· - Generation of projection data
· - Integrated 3D reconstruction
· - Modelling of test specimen using simple geometric objects
· - Import of CAD data in STL format
· - Modelling of many different materials and alloys
· - Support of multi-threading for reduced computing time
· - Graphical user interface
· - Realistic source simulation (focal spot, polychromatism, etc.)
· - Realistic detector simulation including transfer behavior (MTF), time delay, etc.
· - Realistic simulation effects, e.g. system noise, object scattering, etc.
Fields of Application for Scorpius Xlab® :
· - Supporting measurement and acquisition planning
· - Objective determination of optimal parameters
· - Identification and analysis of determining factors of the acquisition process
· - Estimation of measurement uncertainty
· - Training
Dr Norman Uhlmann is the Director of the Development Centre for X-ray Technology (EZRT), a joint department of both Fraunhofer IZFP, Saarbrücken, and Fraunhofer IIS, Erlangen.
Dr Uhlmann received his MSc from the Institute for Theoretical Physics at the Friedrich-Alexander University, Erlangen in 2001
with a diploma thesis entitled "Molecular dynamics simulations on halo formation in dense ion beams". He received his PhD from the same university in 2005 for work in the area of detector development for medical applications under the supervision of Prof. Dr. Anton with a thesis entitled "Simulations on the Compton Camera and development of two absorption detectors on semiconductor and scintillator basis".
He joined the research staff at Fraunhofer-IIS Development Centre for X-ray Technology in 2005. In 2007 he was appointed
Head of the group “X-ray Sensors and Monte Carlo Simulation. In 2009 he became Deputy Head of the Development Centre for X-ray Technology. Since July 2010 Dr Uhlmann has been Head of the centre.
Dr Uhlmann is active in a number of research areas including :
• X-ray physics, X-ray beam generation and detection (directly and indirectly converting sensors) as well as the interaction of X-rays with matter
• High resolution computed tomography for the structure and density analysis of materials, for material characteristics, material inspection (composites, light metals, plastics) and biology
• X-ray backscattering methods and small angle scattering methods for imaging and analysis of materials
• Installation, operation and optimization of an Electron Probe Microanalyzer (EPMA) as X-ray source with ultra-small focal spots for imaging
• Digital image processing, pattern recognition for extracting characteristics for classification tasks in the automated image data analysis
• Radioscopy systems for various component inspection methods
• Tomosynthesis, laminography (method for reconstruction from incomplete data sets)
Dr Uhlmann is a member of the German Physical Society (DPG) and the German Society for Non-destructive Testing (DGZfP)
where he serves on expert committees in radiographic inspection and computed tomography and image processing in radioscopy.
Dr Uhlmann in involved with a wide range of research collaboration including :
• Cluster of Excellence Engineering of Advanced Materials, FAU Erlangen-Nürnberg
• Chair for Adhesion and Interphases in Polymers, Prof. Dr. W. Possart, University of Saarland
• Institute of Theoretical and Applied Mechanics (ITAM CAS), PhD. D. Vavrik, Prague, Czech Republic
• Institute for Experimental and Applied Physics, CTU Czech Technical University, Ing. DrSc. Stanislav Pospisil, Prague, Czech Republic
• Chair for Material Science and Material Mechanics, Technische Universität München, Munich, Faculty for Mechanical Engineering, Prof. Dr. mont. Ewald Werner
• DLR Deutsches Zentrum für Luft- und Raumfahrt (German Aerospace Center), Institute for Material Physics in Space, Prof. Dr. Andreas Meyer
Prof Randolf Hanke concurrently holds a Professorial Chair at the University of Würzburg in X-ray Microscopy and is Deputy Director of the Fraunhofer Institute for Integrated Circuits. Prof Hanke studied Physics at the University Erlangen and received his diploma in 1988 in the field of Applied Physics and his doctor’s degree in 1996 with an external thesis at the University Erlangen. In 1989, he started as a Scientist at the Fraunhofer-Institute for Integrated Circuits IIS in Erlangen. In 1991, he became a group leader of the new established group Industrial Radioscopic Image Processing. Within the scope of this task, he was responsible for the acquisition and management of different public funded and industrial projects. In 1993, he became an Assistant Head of department and was jointly responsible for the R&D activities of the department Electronic Systems. In 1997, he was assumed his position as Managing Director of the new-founded Department for X-ray Technology. In accordance with the board of directors of the Fraunhofer Gesellschaft, this department was converted to a Fraunhofer Development Centre for X-ray Technology in 1999.
In 2001, he was awarded with the Joseph-von-Fraunhofer-Award for his contributions to the “Automation of Radioscopic Inspection of Lightweight materials”. Prof Hanke is a member of the Deutschen Gesellschaft für Zerstörungsfreie Prüfung (DGZFP) and actively committed to different workshops, scientific committees and commissions. In 2002, he got a university teaching position at the Chair for Materials for Electronics at the University Erlangen. In December 2004, Prof Hanke successfully finished his Master of Business Administration study (EMBA) at TIAS NIMBAS Graduate School of Management (Associated Institute of the University of Bradford, UK). In 2008, Prof Hanke was the first candidate, who was awarded with the new established Max-Grundig-Memorial-Award in the field of Research of new Materials and Processes.
In 1st July 2010, Prof Hanke was appointed to a professorship at the Julius-Maximilians-University Würzburg for the Chair
“X-ray Microscopy” at the Faculty of Physics and Astronomy and has organised and co-organised several international
conferences in the field of Non-destructive Testing and was an invited key note speaker at different conferences.
His Fraunhofer Research Centre currently engages approximately 130 scientists and technicians including students and part time employees.
Who Should Attend
Industry professionals, managers, engineers, researchers, academic staff and students.
This is a non-chargeable workshop. To register online, please click here
For enquiries on seminar content:
Dr Andy Malcolm, Email: andy@SIMTech.a-star.edu.sg
For general enquiries:
Ms Samantha Sukiyama Chan, Email: chanskf@SCEI.a-star.edu.sg