Events

Seminar on EBSD Sample Preparation and Material Characterisation for Manufacturing Industry

Date: 22 Nov 2010 - 22 Nov 2010

Venue: SIMTech Auditorium, Tower Block, Level 3

Introduction

This seminar will provide participants with an overview of the EBSD sample preparation and material characterisation for manufacturing industry, using Advanced Scanning Electron Microscope (SEM), X-ray Microanalysis and Sample Preparation Techniques. Speakers at this seminar include Ms Chow Shue Yin, Application Specialist from Carl Zeiss NTS; Mr Henry Cai, Application Specialist from Carl Zeiss SMT; Mr Chuang Yen, Area Manager (Pacific Rim) from Gatan Inc.; Ms Tina Overgaard, Regional Sales Manager from Struers, Dr Jiao Huisheng, Applications Scientist from Oxford Instruments and Dr Tung Siew Kong, Senior Scientist from SIMTech.

Abstract
EBSD is a powerful scanning electron microscope based diffraction technique that provides quantitative crystallographic analysis from regions as small as a few tens of nanometers at the surface of bulk samples. The technique has become highly automated and data acquisition rates are becoming increasingly rapid so that highly detailed maps showing a wealth of crystallographic information over large areas of a sample can be readily generated. EBSD is firmly established as an indispensable tool for the quantitative characterisation of crystalline samples and is used extensively in many materials research institutions. EBSD is being brought to an ever expanding range of applications in metals, ceramics and semiconductors, etc.

About the Speakers
Ms Chow Shue Yin graduated from the National University of Singapore with Bachelor of Science (Honours), majoring in Physics in 1999. She joined the Institute of Materials Research & Engineering from 2000 to 2008 as Research Officer primarily to characterise materials using Transmission Electron Microscopes. She joined Carl Zeiss NTS Pte Ltd since June 2008 as Application Specialist. 

 

Mr Henry Cai graduated from Nanyang Technological University (NTU) with a Bachelor of Engineering (Hons) Degree in 2004. He started his engineering career with STATS ChipPAC as a Test Product Engineer. Thereafter, he was employed by NTU as a Project Officer from 2008 to 2010. During this period, his main research project involved microelectronics failure analysis with specialisation in material characterisation using SEM, FIB and TEM. Apart from his part-time pursuit of his PhD study on metallic nanowires interconnect at NTU, Mr Cai is currently employed by Carl Zeiss at the Nano Technology Systems Division (NTS) as an Application Specialist responsible for all SEM and FIB application support in South East Asia. 
 
Mr Chuang Yen (Willis) graduated from the University of South Australia Chinese MBA Program in 2005. He joined Gatan Inc as an Area Manager (Pacific Rim) in 2004. He is responsible for sales and service matter in Asia. 

Ms Tina Overgaard is a Regional Sales Manager responsible for sales, application and training for Struers in South Asia. She was also in collaboration with Struers Headquarters in developing methods for EBSD sample preparation, among others for ferrous metals and electronic components. Prior to her posting to Singapore, Ms Overgaard was a trainer in Struers Headquarters training lab responsible for training and evaluation for Struers subsidiary materialographers. 

Dr JiaoHuisheng obtained his PhD in Metallurgy and Materials obtained from Birmingham University in 2002. He has 20 years experience in TEM and SEM for materials research as well as profound understanding of EBSD technique for more than 10 years with extensive experience in the applications of EBSD in microstructure characterising. He is an Application Scientist at Oxford Instruments.

Dr Tung Siew Kong studied microstructural modifications of nickel-base brazes and the elimination of intermetallic compounds in these brazes for applications in wide-gap brazing for nickel base supper alloy aero-engine turbine vanes in his PhD project.  He worked for 10 years in NUS (National University of Singapore) and has extensively consulted on projects in mechanical failure analysis during this period. He joined the Diagnostic Unit in 1998 and worked in the area of materials characterisation and testing. He was seconded for two years from 2006 to 2008 to a solders and solder fluxes manufacturing company as the Head of its R&D Department. Dr Tung is a Senior Scientist at SIMTech. His research interests are in the microstructural modification and development of alloys, particularly those for industrial applications, such as lead-free solder alloys, copper alloys, and nickel-base superalloys. He does work in the development of methods and devices for materials characterisation and testing.  

Programme
8.45am         Registration
9.00am         Opening Address & Introduction
9.15am         MERLIN - Analytical System for Sub-nanometer World by Ms Chow Shue Yin, Carl Zeiss
10.00am       Preparation Difficulties for EBSD in general Part I by Ms Tina Overgaard, Struers
10.45am       Tea Break & Networking
11.05am       Preparation Difficulties for EBSD in general Part II by Ms Tina Overgaard, Struers
11.50am       Ion Mill for EBSD Applications, Mr Chuang Yen (Willis), Gatan (Please click for more slides)
12.35pm       Lunch & Networking
1.30pm        Introduction and Latest Development on EBSD by Dr Jiao Huisheng, Oxford Instruments
2.15pm        Application of EBSD for the Intermetallic and Solar Cell by Dr Jiao Huisheng, Oxford Instruments
3.00pm        3D EDX and EBSD with Cross Beam by Mr Henry Cai, Carl Zeiss SMT
3.45pm        Tea Break & Networking
4.05pm        Properties Changes in Crystal Structure of Ductile Alloy by Dr Tung Siew Kong, SIMTech
5.00pm        Q&A

Registration
Registration for the seminar is free of charge. Seats are available on a first-come, first-served basis.
To reserve a seat for this seminar, please register online before 19 November 2010.


Note: A full-day workshop on EBSD Analysis will be held on 23 November 2010, 9.00am-5.00pm, SIMTech Sample Preparation Lab, SEM Lab and Discussion Room, SIMTech Valley Block, Level 3.
Workshop Fee: $100.00 (inclusive of 7% GST)
SMS Members: $80 (after 20% discount)

All cheques and bank drafts must be made payable to "Singapore Institute of Manufacturing Technology", crossed and marked "A/C payee only'. The workshop title should be written on the back of the cheque.

Contact Us
For technical enquiries: Ms Ng Fern Lan, Email: flng@SIMTech.a-star.edu.sg; ; Tel: 6793 8498

For general enquiries: Ms Alice Koh, Email: kohth@SCEI.a-star.edu.sg; Tel: 6793 8249