Invited Research Lecture on Con-focal Scanning Systems for Precision Metrology: Some Novel Applications

Date: 16 Apr 2010 - 16 Apr 2010

Venue: SIMTech Training Rooms 1 & 2

Jointly organised by SIMTech (Singapore Institute of Manufacturing Technology), NMC (National Metrology Centre) and OPSS (Optics and Photonics Society of Singapore), this lecture is very relevant to researchers in the areas of precision measurements, optical engineering and surface characterisation, precision manufacturing and testing.

The presentation will provide an overview of con-focal scanning systems using single point laser and chromatic aberration sensors with special focus on the limitations and advantages of such systems. Consideration will be given to both the measurement and the analysis of a range of surfaces, including the recent novel application areas, such as aspheric surfaces, structured surfaces, carbon-nano-tube surfaces, the analysis of surface wear and a recent study of grooved surfaces related to early sound recordings.

About the Speaker
John McBride is Professor of Electro-mechanical Engineering in the School of Engineering Sciences at the University of Southampton, UK. He is chair of the Electro-mechanical Research Group. In 2006, he was awarded the IEEE Holm Scientific Achievement award for his work on electrical contact surfaces. In 2008, he was awarded the James A Lindner prize for his work on the Sound Archive project. This international award was made at the annual meeting of the AMIA (American Medical Informatics Association), IASAA (Association of Sound & Audiovisual Archives), Georgia, USA. In 2001, he established the metrology company TaiCaan Technologies Ltd, and in 2009, the High Speed Imaging Company TaiCaan Research Ltd. His main research interest include electrical contacts, metrology and instrumentation. He is associate editor of the IEEE Transactions on Components and Packing Technologies(CPT) and a member of the organising committee for the IEEE Holm Conference on Electrical Contacts.

10.45am:     Registration
11.00am:     Lecture by Professor John McBride
12.00pm:     End

Pre-registration for the lecture is necessary. Seats are available on a first-come, first-served basis. 

Who Should Attend
Research scientists, engineers, academic staff, engineering and science students.

For technical enquiries: Dr Zhao Liping, Precision Measurements Group, Email:
For general enquiries: Alice Koh, Email: