Technology Lecture on Manufacturing Test of Nanometer Integrated Circuits

Date: 26 Jan 2010 - 26 Jan 2010

Venue: Auditorium, Level 3, SIMTech Tower Block, 71 Nanyang Drive

Research work in the Advanced Chip Testing Laboratory of the Electrical and Computer Engineering Department at Carnegie Mellon University is centred on extracting valuable information from the data generated from testing integrated circuits (ICs). Since yield is not 100%, the main objective of test is to determine if the IC is good or bad. Today, however, test is being used to provide more information about failing chips, answering questions about whether the design, the process or some combination of the two is responsible for failure. The information extracted is, ideally used to improve design, fabrication and even test itself.

In this talk, an overview of all the research in ACTL will be described followed by a detailed description of a diagnosis-based approach for effectively evaluating test metrics and emerging fault models without performing expensive silicon-based test experiments. Silicon results from the application of this methodology to chips from LSI, IBM and Nvidia will be presented.


1.30pm      Registration
2.00pm      Presentation by Prof Shawn Blanton
3.00pm      End


About Professor Blanton
Shawn Blanton is Professor in the Department of Electrical and Computer Engineering at Carnegie Mellon University where he serves as director of the Centre for Silicon System Implementation (CSSI), an organisation consisting of 18 faculty members and over 80 students focused on the design and manufacture of silicon-based systems. He received the Bachelor's degree in engineering from Calvin College in 1987, a Master's degree in Electrical Engineering in 1989 from the University of Arizona, and a Ph.D. degree in Computer Science and Engineering from the University of Michigan, Ann Arbor in 1995.

Professor Blanton’s research interests include the verification, test and diagnosis of integrated, heterogeneous systems. He has published over 90 papers in these areas and has several issued and pending patents in the area of IC test and diagnosis. Prof. Blanton has received the National Science Foundation Career Award for the development of a microelectromechanical systems (MEMS) testing methodology and two IBM Faculty Partnership Awards. He is a Fellow of the IEEE, and is the recipient of the 2006 Emerald Award for outstanding leadership in recruiting and mentoring minorities for advanced degrees in science and technology.


This technology lecture is free of charge. To reserve a seat, please register online before 25 January 2010


Registration enquiries: Ms Samantha Chan. Email :