Events

Invited Research Lecture on Recent Trends and Development in Three-dimensional Profilometry Technology for Industrial Applications

Date: 01 Jul 2008 - 01 Jul 2008

Venue: SIMTech Training Room 1, Level 3, Tower Block


Introduction
In recent years, surface profile measurement has become more and more important in various industrial applications. Two-dimensional and three-dimensional optical profilometry has successfully applied to various industrial fields such as shape measurement of a soft object, including a human body as well as solid objects like a car body. For more prevalent use of three-dimensional techniques, a few more tasks are required to be sophisticated from the view point of practical use. Some research works have been developed to cope with these requirements.

This presentation presents an overview of the state-of-the-art 3-dimensional profile measurement technologies. It also details the new trends in 3-dimensional measurements for industrial applications in Japan will be highlighted.

About the Speaker
Dr Toru Yoshizawa is currently a Professor in the department of Biomedical Engineering, Saitama Medical University and is Professor Emeritus at Tokyo University of Agriculture and Technology. He is one of the initiators of SPIE Japan Chapter and served as Chapter Chair for ten years. He is a fellow of SPIE. His research field covers optical metrology and optomechatronics. He is the editor of a book titled 'Handbook of Optical Metrology: Principles and Applications' soon to be published this year by Taylor & Francis.

Programme
1.30pm   Registration

2.00pm   Presentation Topics
               - Overivew of 3-dimensional Profile measurement technologies
               - Digital Techniques for High Speed Measurement
               - Recent Devices for Reduction in Size and Weight (liquid crystal
                 grating, MS Mirrors)
               - Hybrid sensing for Industrial Use (multi-sensor, CAD)
               - Fabrication of Shapes from Measured Data (rapid prototyping,
                 micromachining)
               - Inner Profile Measurement
               - Recent Trends in Japanese Industry (aircrafts, semiconductors, 
                   banknotes verification)

3.30pm    Refreshments & Networking

4.00 pm   End

Who Should Attend
This presentation is highly recommended for industry professionals in the precision engineering, biomedical, aerospace and marine industries, researchers and academic staff.  

Registration
Pre-registration for the lecture is necessary. Free admission. Seats are available on a first-come, first-served basis. All are welcome.  

Enquiries
For technical enquiries, please contact
Dr Xu Jian, Ag Group Manager, Precision Meaurements Group
Email: jxu@SIMTech.a-star.edu.sg

For registration and general enquiries, please contact
Email: alicekoh@SIMTech.a-star.edu.sg