Events

Industrial Seminar & Tutorial: X-ray Technology for Industrial Applications

Date: 12 Dec 2007 - 13 Dec 2007

Venue: Training Rooms 1 & 2 (Tower Block, Level 3)

Pre-Seminar Tutorial

Date & Time : 11 December 2007 (Tuesday)
Time:     1.00pm – 6.00pm

Tutorial
A half-day tutorial focusing on 2D image processing for radiography will be conducted by keynote speaker, Professor Ewert. This is a theory cum demonstration tutorial in which participants will be provided with computers and software for hands-on practical interactive training during the session. Personal notebooks/laptops may also be used. Material to be covered includes:
  •   Image viewing and basic functions as contrast, brightness, gamma, correction and histogram correction.   •   Basic filters (high and low pass, median).  
  •   Measurement of basic spatial resolution (based on CEN and ASTM standards).  
  •   Measurement of signal noise and contrast noise ratio (based on CEN and ASTM standards).  
  •   Long term stability for Computed Radiography by the standardized phantom.  
  •   Wall thickness measurement and corrosion depth measurement fortangential and double wall technique
  •   Comparison of digital radiographs

Seminar
The two-day seminar aims to raise awareness of X-ray technology and its capabilities amongst potential industrial users in Singapore and to provide a platform for networking amongst the various vendors, researchers and engineers involved in this technology.

Keynote presentations will be given by renowned international experts from the Development Centre for X-ray Technology at Fraunhofer-IIS and the German Federal Institute for Materials Research and Testing (BAM). Technical presentations will be given by senior engineers from a number of leading X-ray system developers and by engineers and scientists from SIMTech, NTU and other A*STAR Research Institutes.

The seminar will comprise six sessions over the two days covering:
  •   X-ray Source Technology  
  •   2D and 3D Imaging including tomography and laminography  
  •   X-ray Characterisation including XRD, XRF and XPS
  •   Commercial Systems and Applications

Who Should Attend

The pre-seminar tutorial and full-day seminars are targeted at researchers, scientists, engineers and managers from academia, research institutes and industrial companies. 
 
Registration

Registration is on a first-come-first served basis. Pre-registration for both events is necessary. 
Registration Fee (inclusive of 7% GST)

Pre-seminar Half-day Tutorial (11/12) SMS member: S$80 per pax Non-SMS member: $100 per pax
2-day Seminar (12/12 & 13/12) SMS member: S$120 per pax Non-SMS member: S$150 per pax
Both Tutorial & Seminar SMS member: S$180 per pax Non-SMS member: S$225 per pax

SIMTech members enjoy 20% discount, terms and conditions apply.

For enquiry on SMS Membership: Please contact Devi at 6793 8388 or email: SMS@SIMTech.a-star.edu.sg