Technology Lecture: Nano Scale Dimensional Metrology and Application
Date: 19 Sep 2007 - 19 Sep 2007
Venue: Auditorium, Level 3, SIMTech Tower Block
Progress in nanometric motion control at UNC Charlotte
In this talk Prof Hocken will describe progress on three different machines at Charlotte. The first machine is the Sub-Atomic Measuring Machine that is being upgraded to picometer precision. The second is the Multi-scale Alignment and Positioning system to be used for nanoimprinting and the third is a multi-axis nanometric stage to be used for probe calibration. All systems use different bearings and very different design concepts.
Accurate measurement of master spheres
A new instrument was built at Charlotte for the accurate measurement of spheres. The instrument uses an old concept but refines it to reduce the necessary compensation for contact deformation. Spheres measured on this instrument were also measured at National Institute of Standards and Technology (NIST-USA) and Physikalisch-Technische Bundesanstalt (PTB-Germany) and the numbers compared to those obtained at UNC Charlotte.
Vibrating probe with a virtual tip
As part of a PhD thesis a special probe was recently developed that requires no spherical tip. This probe uses the vibration modes of a carbon fibre to generate a virtual tip and has very high resolution. It has been patented and the patent licensed to a local company, InsituTech.
Professor Robert J Hocken is recognised for his contributions to the art and science of precision engineering, and to the education and training of a new generation of precision engineers and metrologists. Prof Hocken earned B. A. degrees in both physics and mathematics from Oregon State University and M. A. and Ph. D. degrees in physics from the State University of New York at Stony Brook. His doctoral work, completed in 1973, included an early application of heterodyne laser interferometry in precision metrology – in particular to the measurement of the refractive index of xenon near its liquid-gas phase transition. During 1974-75, he continued his work in experimental critical point thermodynamics as an NBS-NRC Postdoctoral Fellow in the Heat Division of the National Bureau of Standards (since 1988, the National Institute of Standards and Technology – NIST). In 1975 he joined the permanent staff of NBS as a physicist in the Dimensional Technology Section. Over the next dozen years or so, Prof Hocken assumed positions of increasing technical leadership and responsibility, becoming a Group Leader in Dimensional Metrology, Chief of the Automated Production Technology Division, and finally Chief of the Precision Engineering Division.
During his years at NIST, Prof Hocken earned an international reputation for technical excellence through his pioneering work in error modelling, error mapping, and software correction of coordinate measuring machines (CMMs) and machine tools, the large-scale metrology of liquid natural gas container ships, and the applications of stabilised lasers to problems of high-accuracy metrology. In the latter area, Prof Hocken lead the design and construction of a precise polarimeter for measurements of sugar concentration, an interferometer for measuring long-term dimensional stability of beryllium, and the original tracking interferometer system (now commercially available as the laser tracker). In 1989 Prof Hocken left NIST and assumed the Norvin Kennedy Dickerson, Jr., Distinguished Professorship of Precision Engineering in the Department of Mechanical Engineering and Engineering Science at the University of North Carolina at Charlotte. He catalysed the creation, and serves as Director, of the UNCC Center for Precision Metrology which is a widely recognised center of excellence for state-of-the-art graduate studies and research in areas of design, manufacturing, processes, and controls relating to precision metrology.
Prof Hocken is a Charter Member of ASPE, has served on numerous ASPE committees and has been twice elected to the Board of Directors. In addition he has served the Society for many years by teaching a very successful series of popular tutorials at our Annual Meetings. He is an Active Member of the International Institution for Production Engineering Research (CIRP), a member of the American Physical Society, a Senior Member and Fellow of the Society for Manufacturing Engineers, and a member of the American Society for Mechanical Engineers. Among his many honours and awards are Gold and Silver Medals from the U. S. Department of Commerce, the F. W. Taylor International Research Award from SME, and the F. W. Taylor Medal from CIRP. Most recently, Prof Hocken was awarded the First Citizens Bank Scholars Medal from UNCC, the University's highest honour for scholarship and intellectual inquiry.
Who Should Attend
Manager, engineers from the electronics, precision engineering industries and researchers, lecturers and students from universities and research institutes.
Pre-registration for the lecture is required. Admission is free. All are welcome.
Seats are available on a first-come-first-served basis.
To register, please send your name, job title and organisation name to eventspostmaster@SIMTech.a-star.edu.sg