Invited Research Lecture: Micro and Nano Characterization of Materials and Devices

Date: 30 Oct 2006 - 30 Oct 2006

Venue: Auditorium, Tower Block, SIMTech, 71 Nanyang Drive


An overview on various modes of operating scanning electron and probe microscopes to achieve comprehensive local information of important material parameter and device function will be presented. The aim of the work is to evaluate the material with regards to its realiability. This talk will highlight advanced solutions to solve problems in material fabrication, characterization and IC design.

About Prof Balk 

Prof L.J. Balk is a full Professor, Professorship for Electronics, Faculty of Electrical, Information and Media Engineering and Executive Director of the Institute of Polymer Technology from Wuppertal University of Germany. He received his Diplomphysiker (Physicist) and Doctorial degrees in 1971 and 1976 respectively;both at Technical University of Aachen, Germany. Prof Balk is a Fellow of the Institute of Physics, while holding visiting and adjunct professorship in various universities including NUS, Singapore. His research interests are in the areas of development and optimization of scanning probe and electron microscopical techniques, reliability and circuit diagnostics of electronic devices, applications range from pure electronic materials and devices to inorganics like functional ceramics, organic materials and devices and biological materials such as human tissue, nanolithography. In these areas, Prof Balk has published 230 publications and conference presentations, out of which 51 invited or keynote papers, 112 invited seminar talks in industry and academy and 7 international patents.

Who Should Attend

R&D Managers, Professors, Research Scientists and Engineers. Microscope developers and vendors in material related areas including semiconductor devices/IC design and failure analysis, bioscience, chemical, electronics and precision engineering.


Free admission. All are welcome. Registration is on a first-come-first served basis. Please include name of participant, company name, contact number and email address when you register via:

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