Seminar on Particle Detection and Analysis for Industrial Application

Date: 25 Nov 2005 - 25 Nov 2005

Venue: SIMTech, Seminar Room, Valley Block, Level 1


This one-day seminar focuses on the importance of particle detection and analysis in the different industries. Participants will be introduced to how particle detection and analysis can be optimised using the latest advancement in X-ray microanalysis.

Seminar Programme

- Introduction of Diagnostic Unit (DU) facilities and capabilities in SIMTech
- INCA Feature general introduction and background
- Detrimental Effects of inclusions/particles in metal components
- Forensic application of SEM/EDX
- Gunshot residue analysis
- Application on INCA Feature
- INCA Feature software Demo and workshop