Solving Manufacturing Problems using Scanning Electron Microscopy and X-ray Microanalysis

Date: 04 Aug 2005 - 04 Aug 2005

Venue: SIMTech, Seminar Room, Valley Block, Level 1


Amongst the numerous characterisation techniques used to study materials and products, Scanning Electron Microscopy (SEM), Energy and Wavelength Dispersive Spectrometry (EDS, WDS) are some of most useful and complementary techniques available. This seminar will present the latest developments in SEM, EDS and WDS and highlight how these developments can help solve manufacturing problems in the industry.

Seminar Programme

1) Introduction of Diagnostic Unit (DU) facilities and capabilities in SIMTech by Dr Tung Siew Kong, Head of DU, SIMTech
2) Industry and research activities in Electron Microscopy Laboratory by Mr Wilson Sim and Ms Ng Fern Lan, SIMTech 
3) Highest versatility in Scanning Electron Microscopy Technology for analysis of difficult samples by Dr Michael Hilt, Carl Zeiss NTS GmbH, Germany
4) Reliable X-ray Microanalysis in the Micron and Sub-micron range using Energy and Wavelength Dispersive Spectrometry by Dr Simon Burgess, Oxford Instruments, UK
5) Acquisition, Handling and Sharing of Very Large Digital Images for Image Processing by Mr Tuck Kong See Tho, Soft Imaging System, Malaysia 

Laboratory Demonstration :
- using different pressure modes of scanning electron microscope for difficult samples
- solving manufacturing problems using EDS, WDS and imaging analysis software