This presentation introduces emerging technologies and selected best practices on remote monitoring and predictive maintenance techniques to enable machine and systems to achieve near-zero breakdown performance. Prognostics tools and tether-free technologies will be discussed to effectively transform traditional maintenance from ``fail and fix (FAF)`` practices to ``predict and prevent (PAP)`` methodologies. Examples will be given to illustrate the lessons learned from the automotive industry and service industry.
About Prof Lee
Prof Jay Lee is L.W. Scott Alter Chair Professor and Ohio Eminent Scholar in Advanced Manufacturing at the University of Cincinnati (effective April 2005). Currently, he holds a position as Wisconsin Distinguished Professor and Rockwell Automation Professor at the University of Wisconsin-Milwaukee and is founding director of National Science Foundation (NSF) Industry/University Cooperative Research Center (I/UCRC) on Intelligent Maintenance Systems (IMS) which is a multi-campus NSF Center of Excellence between the Univ. of Wisconsin-Milwaukee and the University of Michigan-Ann Arbor. He also serves as a co-director of Industrial Innovation Center (IIC) at Shanghai Jiao Tong Univ. (www.iicsjtu.com).
Previously, he served as R&D Director for Product Development and Manufacturing Department at United Technologies Research Center (UTRC), E. Hartford, CT, and was responsible for the strategic direction and R&D activities for next-generation products and manufacturing, and service technologies. Prior to joining UTRC, he served as Program Directors for a number of programs at NSF during 1991-1998, including the Engineering Research Centers (ERCs) Program, the Industry/University Cooperative Research Centers (I/UCRCs) Program, and the Materials Processing and Manufacturing Program (MPM). In addition, he had served as an adjunct professor for a number of academic institutions, including Johns Hopkins University, where he was an adjunct faculty member for the School of Engineering and Applied Science as well as for the Hopkins Technical Management Program during 1992-1998. He conducted research work at the Mechanical Engineering Lab of the Ministry of International Trades and Industry (MITI) as a Japan Science and Technology Agency (STA) Fellow in 1995, a Japan Society for Promotion of Science (JSPS) Fellow at the University of Tokyo as in 1997, and a visiting professor at Swiss Institute of Technology (EFFL), Lausanne, Switzerland in July 2004.
His current research focuses on smart infotronics-based prognostics technologies including predictive machine degradation assessment, remote monitoring, embedded prognostics, and self-maintenance systems. Currently, he serves as member of Board on Manufacturing and Engineering Design (BMAED) of National Research Council (NRC)/National Academy of Engineering. Previously, he served as member of Board of Directors for the National Center for Manufacturing Science (NCMS), the chairman of the Manufacturing Engineering Div. And Materials Handling Engineering Div. of ASME, and committee member for a number of National Research Council (NRC) study committees. In addition, he had served as editorial board and associated editors for a number of journals, including the ASME Journal on Manufacturing Science & Engineering, IEEE Transaction on Systems, Man, and Cybernetics, International Journal on Quality, Reliability, and Safety, etc. He has authored/co-authored over 100 technical publications, edited two books, contributed numerous book chapters, three US patents, 2 trademarks, and had delivered numerous invited lectures and speeches, including over 60 invited keynote and plenary speeches at major international conferences.
Prof Lee received his B.S degree from Taiwan, a M.S. in Mechanical Engineering from the University of Wisconsin-Madison, a M.S. in Industrial Management from the State University of New York at Stony Brook, and D.Sc. in Mechanical Engineering from the George Washington University. He received Milwaukee Mayor Technology Award in 2003 and was a recipient of SME Outstanding Young Manufacturing Engineering Award in 1992. He is also a Fellow of ASME and SME.
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