Researcher Portfolio

Xie Hong (Ms)
Principal Research Engineer I
67938955
Measurements and Characterisation Unit
Introduction:Prior to joining SIMTech, Xie Hong worked for UESTC (University of Electronic Science and Technology of China) on various R&D projects in processing and surface characterisation of advanced bulk and thin film materials by XPS, AES and SIMS, etc. After joining SIMTech at end 1996 until 1999, she worked on a collaborative project on processing and characterisation of superhard coatings of diamond-like carbon, diamond and carbon nitride using PVD and CVD deposition techniques.

Since 1999, Xie Hong has been actively involving in various industrial and in-house projects covering thin film characterisation of film thickness, microstructure, optical properties by ellipsometry, FTIR, Raman and UV-VIS-IR spectrometer; thermal analysis on polymeric and alloy materials and components.
Research Interest:Spectroscopy; surface and thin film characterisations; optical thin films; thermal analysis
BioNotes:Spectroscopy; surface and thin film characterisations; optical thin films; thermal analysis
Publications:1. H. Xie, F.L. Ng and X.T. Zeng, "Spectroscopic ellipsometry study of thin film thermo-optical properties", Thin Solid Films, vol. 517, pp. 5066-5069, 2009.
2. Wei Jun, Zhiping Wang and Xie Hong, "Method of Wafer/Substrate Bonding", United States patent, Patent No. US7, 192,841 B2, Date of Patent: 20 March, 2007.
3. H. Xie, J. Wei, X. Zhang, "Characterization of Sol-gel Thin Films by Spectroscopic Ellipsometry", Journal of Physics Series, vol. 28, pp.95-99, 2006.
4. H. Xie and B.H. Tan, "Spectroscopic Ellipsometric Analysis of Tantalum Oxide Thin Films--Effect of the Pretreatment on Silicon Substrate", International Journal for Manufacturing Science and Technology, vol. 6 pp.  5-11, 2005.
5. K. Y. Low, H. Xie, Z. Xiong and G. C. Lim, "Femtosecond laser direct writing of embedded optical waveguides in aliminosilicate glass", Applied Physics A: Materials Science & Processing, vol.81,  pp. 1633-1638, 2005. 
6. H. Xie and J. Wei, "Characterization of Low-k Dielectric Sol-gel Coatings by Spectroscopic Ellipsometry", ASME Congress, Orlando, FL, USA, 4-11 Nov 2005.
7. H. Xie, B. H. Tan, F. L. Ng and P. A. Collier, "Thermal Stability Study of Tantalum Nitride Thin Films by Spectroscopic Ellipsometry", International Journal of Nanoscience, vol.13, pp. 489-496, 2004.
8. X. Z. Ding, X. T. Zeng and Hong Xie, "Cubic Boron Nitride Films Deposited by Unbalanced RF Magnetron Sputtering and Pulsed DC Substrate Bias", Thin Solid Films, vol. 429, pp.  22-27, 2003.
9. S. Zhang, X. T. Zeng, H. Xie and P. Hing, "A phenomenological approach for Id/Ig ratio and sp3 fraction of magnetron sputtered a-C films", Surface and Coatings Technology, vol.123, pp. 256-260, 2000.
10. Chang Q Sun, H Xie and W Zhang, "Preferential oxidation of diamond {111}", J. Phys. D: Appl. Phys, vol.33, pp. 1-4, 2000.
11. S. Zhang, H. Xie, X.T. Zeng and P. Hing, "Residual Stress Characterization of Diamond-like Carbon Coatings by X-ray Diffraction Method", Surface and Coatings Technology, vol.122, pp.  219-224, 1999.
Awards:S. Zhang, H. Xie, J. Guo, The 1st Prize of Materialography Competition 1998, Institute of Materials (East Asia): "TEM image of an amorphous carbon (a-C:H) film of thickness 0.1 microns prepared via magnetron sputtering of graphite in Ar + H2 atmosphere.