Researcher Portfolio

Seck Hon Luen (Dr)
Scientist I
6319 4492
Precision Measurements

Hon Luen is a researcher at Singapore Institute of Manufacturing Technology. He received his Bachelor and Doctoral degree in Electrical Electronic Engineering from Nanyang Technological University in 2005 and 2013, respectively. His current research interests include optical coherence imaging and diffraction imaging.

Research Interest:Optical coherence tomography, Interferometry

Ph.D., Nanyang Technological University, Singapore, 2013
B.Eng., Nanyang Technological University, Singapore, 2005


1. Hon Luen Seck, Ying Zhang, Yeng Chai Soh, "Autocorrelation noise removal for optical coherence tomography by sparse filter design," Journal of Biomedical Optics, Vol.17, Issue 7, 076029, (2012).

2. Hon Luen Seck, Ying Zhang, Yeng Chai Soh, "High resolution optical coherence tomography by l1-optimization," Optics Communications, Vol.284, Issue 7, 1752-1759, (2011).