Researcher Portfolio

Isakov Dmitry (Dr)
Scientist II
6319 4476
Precision Measurements
Introduction:

Isakov Dmitry received his M.Sc. From Physics Department of Moscow State University in 2004 and Ph.D. degree from Electrical and Computer Engineering Department of National University of Singapore (NUS), Singapore in 2010. From 2008 he joined the optics team in Singapore Institute of Manufacturing Technology (SIMTech), Agency for Science Technology and Research (A*STAR). His research interests are currently focused on vacuum assisted thermal management in Transportation, Constriction and Oil&Gas

Research Interest:HVAC, Radiant Cooling, Non-Destructive Testing, Failure Analysis
BioNotes:

Ph.D., National University of Singapore, Singapore, Aug 2008
M.Sc., Moscow State University, Russia, Jan 2004

Publications:
  1. D.V. Isakov, “Infrared detection of water ingress in a composite laminate crevice based on room temperature evaporation, ” International Journal of Heat and Mass Transfer, Vol. 86, p. 39,  2015.

  2. K.A.C. Lee, D.V. Isakov, “Multi-Point Laser Heating Source for Thermography Application in Composite Testing”, NDT of Composites, Seattle, USA,  May 4-6, 2015.

  3. Y. Ding, D. P. Poenar , and D. V. Isakov, “Local current measurements for avalanche breakdown in Silicon p-n junctions” 19th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), 2012, pp. 1-6.  

  4. D. V. Isakov, Y. Zhang, L. J. Balk, and J. C. H. Phang, “Optical near-field probe with embedded gallium scattering center”, Applied Physics Letters, Vol. 94, 253108, 2009;  selected for the  July 6, 2009 issue of Virtual Journal of Nanoscale Science & Technology.

Awards:

Best Research Achievement Award from SIMTech for development and demonstration of “Vacuum Assisted Thermography” technology. 10 April 2015

Achievement Award from A*STAR Aerospace Programme for Research Project “Heat Damage Assessment Methods for Composites” 24 September 2013

IEEE Best Poster Paper at IPFA 2012 for the paper “Local current measurements for avalanche breakdown in Silicon p-n junctions”. June 6, 201

IEEE Best Student Paper Award 2010 and 3rd Prize for the paper titled “Optical near-field probe with embedded gallium scattering centre”. January 22, 2010:

Best Paper Award for plenary presentation at ISTFA 2008 with paper “Applications of Scanning Near-field Photon Emission Microscopy”m November 17, 2009

Joint SIMTech Research Award for the project of Scanning Near-field Photon Emission Microscopy, March 06, 2009

Isakov Dmitry; Lee Khee Aik Christopher, Intellectual Property Office of Singapore (IPOS) application No.: 10201501913V (USA application #14/645,636).  Date of publication: 29 Oct 2015
Isakov Dmitry, IPOS application No.: 10201500118X (USA application #14/598,186). Date of publication: 28 Aug 2015
Isakov Dmitry, IPOS application No.: 10201702478Q