Researcher Portfolio

Kok Shaw Wei (Dr)
Scientist III
6319 4478
Introduction:Prior to joining SIMTech in Dec 2004, Dr Kok pursued his PhD in School of Electrical and Electronic Engineering, Nanyang Technological University in the research area of optical communication using of CDMA protocol. Currently, he is involved in research area of freeform dimensional measurement techniques and X-Ray phase contrast imaging.
Research Interest:Freeform Measurement, Metrology, X-Ray Phase Contrast
BioNotes:Ph.D., Nanyang Technological University, Singapore, 2006
B.Eng., Nanyang Technological University, Singapore, 2001

L. Zhuang, Y. Zhang, S. W. Kok, B. P. Ng, Y. C. Soh, "Reflection-based near-field ellipsometry for thin film characterization", Ultramicroscopy, vol. 124, pp26-34, 2012

B. Hu, Q. Wang, S. W. Kok, Y. Zhang, "Active Focal Length Control of Terahertz Slitted Plane Lenses by Magnetoplasmons ", Plasmonics, vol. 7, pp. 191-199, 2011

Awards:IES Prestigious Engineering Achievement Awards 2005
SIMTech Research Awards 2007
SIMTech Friday Presentation Awards 2007
SIMTech Research Awards 2008