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Advanced Imaging Technologies for Automatic Optical Inspection and Dimensional Measurement

(MasterClass in Emerging Manufacturing Technologies)

Introduction

Machine vision and the provision of automatic inspection capabilities offers extensive support across a wide array of industries and applications. In today’s landscape, almost every manufacturer involved in any form of production and delivery of goods to the market derives significant benefits from visual inspection of product quality. The benefits of machine vision are abundant, contributing to improved quality and productivity, while driving down manufacturing costs.

Participants will be able to gain valuable insights and knowledge on advanced technologies that are being used in automatic optical inspection and dimensional measurements. The masterclass is designed specifically based on local industry demand and have been structured into various sessions covering key elements and techniques required for the development of 2D and 3D automated inspection systems. Through the hands-on experience and the advanced topics covered, including applied optics, lighting design, imaging and sensing systems, participants will be able to further develop specific competencies needed in developing automated optical inspection systems. This will enable participants to build on existing capabilities or develop new capabilities in their workplace.

Why This MasterClass

Learn about the key components involved in machine vision system
Learn about lighting technologies for machine vision applications
Simulation and design of optical systems
Learn about optical technologies for 3D dimensional measurement
Learn about image processing technologies in defect detection
Learn from industrial application case studies

Who Should Attend

CEOs and CTOs, technical leaders, engineering managers, engineering supervisors, product managers
System designers, design engineers, R&D engineers, application engineers, sales engineers, inspection and vision technicians, new hires from any manufacturing industry sectors

Programme Agenda

Day 1

(Morning session)

INTRODUCTION TO MACHINE VISION IMAGING AND LIGHTING TECHNOLOGIES - By Dr Li Xiang Leon, A*STAR SIMTech
- Key Components in machine vision systems (Imaging, Illumination, Detector)
- Lighting technologies
- Machine vision technologies for industrial applications (case-study based)
OPTICAL DESIGN AND SIMULATION - by Dr Li Xiang Leon, A*STAR SIMTech
- Telecentric lens design for semiconductor inspection
- Lighting design for machine vision applications

(Afternoon session)

ADVANCED IMAGE-PROCESSING TECHNOLOGIES - By Dr Yin Xiaoming, Mr Jiang Ting Ying, Dr Tan Piau Siong and Dr Li Xiang Leon, A*STAR SIMTech
- Image-processing technologies for wire-tracing in semiconductor inspection
- 2D X-ray image-based porosity detection and analysis
- dPCR software for automatic DNA well detection
- X-ray Micro-Computed Tomography (Micro-CT) in Biological Imaging
- Bio-imaging Systems for Cell Inspection and Measurement

Day 2

(Morning session)

OPTICAL METROLOGY BASED ON STRUCTURED LIGHT TECHNOLOGY – By Associate Professor Qian Kemao, School of Computer Science & Engineering, Nanyang Technological University
- Phase projection
- Phase extraction through phase shifting
- Phase extraction through carrier fringe analysis
- Parallel computing

(Afternoon session)

FOCUS VARIATION TECHNIQUE FOR DIMENSIONAL MEASUREMENTS AND INDUSTRIAL METROLOGY – By Ms Liu Yuchan, A*STAR SIMTech
- Introduction to focus variation technique
- Surface profile and dimensional measurements with focus variation
- Case studies demonstrating industrial applications
NON-CONTACT 3D SCANNING TECHNOLOGY FOR INDUSTRIAL METROLOGY – By Ms Pooja Chaturvedi, A*STAR ARTC
- Introduction to stereo vision triangulation, fringe projection and GOM technology
- Dimension measurement and deviation analysis with GOM technology

Day 3

(Morning session)

PRACTICAL DEMONSTRATION AND HANDS-ON EXPERIMENTATION – By Dr Li Xiang Leon, A*STAR SIMTech
- Smart multi-source lighting test station showcase
- Hands-on experimentation using smart lighting station for semiconductor inspection applications

(Afternoon session)

(Per company basis) TECHNOLOGY SHARING AND BRAINSTORMING SESSION – By Dr Andy Malcolm, A*STAR SIMTech
- Dedicated session with each company to brainstorm and evaluate suitable technologies that they can embark on to increase productivity

Trainers' profile

Dr Qian Kemao is an Associate Professor in the School of Computer Science and Engineering (SCSE) at the Nanyang Technological University (NTU). He graduated from the University of Science and Technology of China (USTC), where he got his BE, ME and PhD degrees. His research interests include optical metrology, image processing, parallel computing, and computer vision. He is internationally known for his contributions to optical metrology and was elected SPIE Fellow and Optica Fellow. He has authored or co-authored two books and over 250 scientific publications, with a Google Scholar citation of over 11,000.

Dr Li Xiang Leon is the Section Manager for the Optics and Imaging Systems with A*STAR Singapore Institute of Manufacturing Technology (SIMTech). His research areas include dimensional measurements, defect inspection, interferometry, wavefront sensing, fiber sensor and bioimaging. His research outputs have been applied in sectors of semiconductor, precision engineering, construction and biomedical.

Upon Completion

Participants will be awarded with a Certificate of Attendance (COA) by SIMTech and/or ARTC if they achieve at least 75% course attendance.

Full Course Fee

The full course fee for this masterclass is $2,800 before funding and prevailing GST.

Nett Course Fee

International Participants	Singapore Citizens, SPRs or LTVP+ Holders
$3,052	$915.60

All fees are inclusive of GST 9%.

Please note that fees and funding amount are subject to change.

Long Term Visit Pass Plus (LTVP+) Holders

The LTVP+ scheme applies to lawful foreign spouses of Singapore Citizens with (i) at least one Singapore Citizen child or are expecting one from the marriage, or at least three years of marriage, and (ii) where the Singapore Citizen sponsor is able to support the family.

All LTVP+ holders can be identified with their green visit pass cards, with the word ‘PLUS’ printed on the back of the card.

The SkillsFuture Credit cannot be applied to offset the masterclasses' course fees.

How course fees are calculated

TYPE	CATEGORY OF INDIVIDUALS
	International Participants	Singapore Citizens, Singapore Permanent Residents and LTVP+ Holders
	FUNDING SOURCE
	Not applicable for SkillsFuture Funding	SkillsFuture Funding (Baseline)
Full Course Fee	$2,800	$2,800
SkillsFuture Funding	Not Applicable	($1,960)
Nett Course Fee	$2,800	$840
GST 9%	$252	$75.60*
Total Nett Course Fee Payable to Training Provider	$3,052	$915.60

* Based on 30% of Full Course Fee

Contact Us

For technical enquiries, please contact:

Dr LI Xiang Leon,
Email: lixiang@SIMTech.a-star.edu.sg

For general enquiries, please contact:

Ms Charlotte LIM,
Email: charlotte_lim@SIMTech.a-star.edu.sg

Registration

Please register for this course through our Course Registration Form for Public Classes.
For the first question, please select Qn1: MasterClasses
Applicants will be placed on our waiting list if the course does not have an upcoming scheduled intake.
Once the next intake is confirmed to commence, SIMTech will contact the applicants to share the class information.

Collaterals

Download brochure

Schedule

MasterClass Title	Training Period	Registration Status
Advanced Imaging Technologies for Automatic Optical Inspection and Dimensional Measurement (MasterClass in Emerging Manufacturing Technologies)	The next intake's schedule is still in the planning stage.

Note: SIMTech and ARTC reserve the right to change the class/schedule/course fee or any details about the course without prior notice to the participants.

Announcement:

From 1 Oct 2023, attendance-taking for SkillsFuture Singapore (SSG)'s funded courses must be done digitally via the Singpass App. More information may be viewed here.

Sessions

: Full day