SEMICONDUCTOR EXHIBIT

High-resolution displays for lighter, more efficient AR headsets

Augmented reality (AR) headsets require compact, power-efficient displays, but traditional Liquid Crystal on Silicon (LCOS) technologies face limitations such as bulky form factors, high power use, and colour breakup. Developed by A*STAR, this new LCOS display reduces pixel size to ~1 μm through submicron-thick liquid crystal cells and optical cavity resonances. The design achieves high contrast with ultra-thin layers, overcoming the drawbacks of conventional LCOS. The display delivers faster switching speeds, lower operating voltages, and significantly improved contrast, making possible lighter, sleeker AR headsets with sharper visuals and longer battery life. This innovation highlights NSTIC’s role in accelerating semiconductor translation and positions LCOS technology for broader adoption in next-generation AR modules.

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High-sensitivity inspection for complex optical structures

Flat optics such as metalenses, augmented reality waveguides and diffractive optical elements are essential to next-generation displays and sensors, but their wafer-scale inspection remains a major hurdle. Conventional amplitude-based tools struggle with non-conductive materials and non-uniform designs, slowing the move from lab to production.

Developed at A*STAR, this prototype inspection tool applies quantitative phase imaging (QPI) to capture optical performance and wavefront phase profiles across entire wafers. Sensitive to nanoscale variations in thickness and refractive index, QPI provides insights that traditional methods miss. Supporting both 8-inch and 12-inch wafers, the system can evaluate metalens focusing efficiency in just 30 minutes, giving manufacturers greater confidence to scale flat optics manufacturing. By combining high sensitivity with fast throughput, the industry may be propelled to adopt advanced optical technologies in displays, imaging and sensing.

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