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Advanced Microanalysis Lab (AML)

Our research group focuses on the development of capabilities related to Transmission Electron Microscopy (TEM) and their applications in understanding the physical/chemical properties of materials at micro/nano/atomic scale. We also provide comprehensive TEM analysis for studying materials at high temperature and under cryo conditions.


  1. Comprehensive TEM analysis: demonstrating the shape, morphology, interface, crystal structures, compositions, defects, etc. 
  2. 3-Dimension (3D) TEM: TEM and STEM tomography illustrate 3D nanostructures while 3D diffraction demonstrates the crystal structures.
  3. Electron holography: showing the amplitude and phase distributions of the materials.
  4. Monochromated Electron Energy Loss Spectroscopy (EELS): high resolution EELS study of materials.
  5. Lorentz TEM: providing information on magnetic domains and domain walls.
  6. Precession Nano Beam Diffraction and Phase/Crystallographic Orientation Mapping: giving quantitatively structural determination and information; complementary to Electron Backscattered Diffraction (EBSD), phase and orientation mapping showing the structures down to nm scale.
2020 12 10 AML(website)