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Advanced Nanoanalysis

The Advanced Nanoanalysis research area in ACI specializes in developing and applying advanced Transmission Electron Microscopy (TEM) techniques to explore the physical and chemical properties of materials at the nano and atomic scales. We offer comprehensive TEM analysis across a wide variety of materials, including those exposed to extreme conditions such as high temperatures and cryogenic environments. Additionally, our lab investigates material dynamics using in situ capabilities with liquid and gas environments. These cutting-edge capabilities open up new possibilities for breakthroughs in fields such as energy storage, catalysis, and next-generation electronics.

Our TEMS

  • Sub-atomic analysis from -170 °C to 1000 °C
  • Analysis performed in vacuum, liquid, and gas environment
  • Ultrafast imaging & mapping with minimum damage to samples with adjustable electron voltage and beam intensity
TEM

Specifications of TEMs

TEMTitanTecnalTalosSpectra
Year2006200820232024
Electron gunfield emission gun with monochromator 80, 200, 300 KVfield emission gun 200 KVHigh-brightness field emission gun 80, 200 KVHigh-brightness field emission gun with monochromator 30, 60, 80, 200, 300 KV
Resolution0.09nm (TEM)
0.10nm (STEM HAADF) 		0.14 nm (TEM)
0.19 nm (STEM HAADF)		0.12 nm (TEM)
0.16 nm (STEM HAADF)		0.06 nm (TEM)
0.05 nm (STEM HAADF)
Spectroscopy

EDS: solid angle 0.3 sr

EELS: Tridiem

EDS: solid angle 1.1 sr

EELS: Quantum

EDS: solid angle 0.9 sr

EDS: solid angle 1.8 sr 

EELS: Continuum

Camera4k x 4k CMOS2k x 2k CCD4k x 4k CMOS

4k x 4k CMOS
3.4k x 3.4k CMOS electron direct detection

Capabilities

Advanced Transmission Electron Microscopy (TEM)

  • Obtain 3D morphological and structural information: TEM and STEM tomography & 3D diffraction (MicroED)
  • Show amplitude and phase distributions: Electron Holography
  • Achieve high resolution elemental and energy distribution: Monochromated Electron Energy Loss Spectroscopy (EELS), Atomic resolution EDS / EELS mapping
  • Provide quantitatively structural information down to nm scale: precession Nano Beam Diffraction and Phase/Crystallographic Orientation Mapping
  • Visualize magnetic domains and domain walls: Lorentz TEM

High/atomic resolution TEM and scanning TEM (STEM) imaging

    High Atomic resolution TEM and scanning TEM (STEM) imagingHigh resolution TEM image of a Te nanowire cross-section (left); Atomic resolution STEM image of SrTiO3 and a layered structure of MoTe2 (centre); Atomic resolution STEM image showing the fusing of Au nanoparticles (right). 

    TEM/STEM tomography & 3D diffraction


    Electron tomography provides information on 3D nanostructures with ~1 nm resolution.

    Electron Holography

    electron holography

    Electron holography shows local phase information with ~5 nm resolution. Above: Mapping of the magnetic structures of iron oxide nanoparticles.

    Atomic resolution EDS/EELS mapping

    Atomic Resolution EDS EELS
    Atomic resolution EDS mapping of SrTiO3.

    Monochromated EELS

    Monochromated EELS
    Monochromated EELS spectra and mapping of Au nanowire.

    Precession nano-beam diffraction and Phase/Crystallographic orientation mapping

    Precession Nano-beam
    Crystallographic orientation mapping of Pt/HfO2/Pt thin film cross section sample. 

    Lorentz TEM

    Lorentz

    In-Situ TEM 

    The in-situ TEM platform enables atomic resolution imaging of solid-liquid, solid-gas interactions and sample dynamics in several areas of research in real-time. The combination of in situ TEM and heating offers limitless potential for scientific exploration and discovery.

    insitu tem 1
    insitu tem 2

    Liquid phase in-situ TEM

    insitu 1
    Capturing the live dynamics of Si nanopillars etched in KOH 
    insitu 2
    Direct visualization of Au nanoparticle bridging at atomic level 

    Advanced Atomic Force Microscopy (AFM)

    We leverage atomic force microscopy (AFM) to control and measure nanoscale interactions, advancing understanding in diverse fields such as soft electronics, nanophotonics, semiconductor physics and nanomanufacturing. Beyond advanced AFM imaging and characterization, we develop custom solutions that overcome limitations in conventional nanometrology and nanofabrication techniques. Our research pushes the boundaries of AFM technology, and we invite you to explore our work and collaborate with us in advancing the field of nanoscience and technology.

    Atomic Force Microscopy Nanoengineering

    Micro/nano-manipulation

    Micro Nano Manipulation
    Manipulation of microparticles and flat plates for advanced force and electrical measurements.

    Microprinting

    microprinting
    Local nanoparticle deposition by microprinting nanoparticle inks.

    Adhesion

    adhesion
    Force-distance measurements give information about the adhesion between two materials.

    Electrical properties

    electrical properties
    Current density vs. voltage graphs on molecules with different chain lengths.

    Fabrication of novel structures

    Fabrication of Novel Structures
    Novel AFM technique enabling fabrication of three-dimensional structures with no stitching errors or misalignments, unlocking an additional dimension for controlling light at the nanoscale.

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