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Materials Analysis and Characterisation

At IMRE, we offer a wide array of state-of-the-art equipment for the analysis and characterization of diverse materials and their properties. The Materials Analysis and Characterization teams at ACI consist of highly experienced research scientists and engineers who specialize in various analytical and characterization techniques. We actively collaborate with researchers across A*STAR, institutes of higher learning, and industry partners.

Our advanced capabilities enable precise material composition analysis, micro-contaminant identification, and quantification—critical for enhancing process control, product quality, and the development of innovative products. We also strive to deepen the understanding of the structure-property relationships of materials and their performance across various applications.

Our services cater to a wide range of industries, including Electronics, Aerospace, Precision Engineering, Chemicals, Food, Healthcare, Pharmaceuticals, and Biotechnology. Beyond routine analysis and characterization, we regularly provide expert advice and develop innovative solutions to address complex challenges in materials analysis.

Capabilities

Surface/Interface Material Analysis

High sensitivity and high-depth resolution profile analysis for identification of ultra-low-level contamination, evaluation of ultra-thin film structures and comprehensive elemental, chemical, and molecular information identification at the surface.
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Time-of-flight Secondary Ion Mass Spectrometry (TOFSIMS) composition analysis of a Ag surface contaminated with poly(dimethyl siloxane) (left); TOFSIMS depth profiling of a multi-layer structure (centre); X-ray photoelectron spectroscopy (XPS) chemical state analysis of polyethylene terephthalate (PET) (right)
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Auger Electron Spectroscopy (AES) elemental maps and depth profiles of the linear-link corrosion spots at the wear track on hard disk surface.

Bulk and Surface Chemical States

High-accuracy material composition analysis, identification, and quantification of materials and micro-contaminants for material, process and product evaluation, etc. 
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Raman spectra of different types of polymers (left); Mapping of material distribution for the surface (centre) and the depth (right).
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Fourier transform infra-red (FTIR) absorption spectra of different tea leaves (left); Gas chromatography mass spectrometry (GC-MS) analysis of tetracosane (centre); In-Plane and Out-plane X-Ray Diffraction (XRD) Measurement (right)

High-resolution Imaging and Analysis

For studying micro- /nano-scale features, morphology and composition at the surface and interfaces.
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Scanning electron microscopy (SEM) imges of insulating materials (left) and liquid samples (Centre); Energy dispersive X-ray spectroscopy (EDS) elemental mapping Au nanoparticles on Polymer (right).
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Focused ion beam scanning electron microscopy (FIB-SEM) cross-sectional analysis (left); Energy dispersive X-ray spectroscopy (EDS) elemental mapping (centre); High-resolution transmission electron microscopy (TEM) analysis for planar view, cross-section and crystallographic spacing determination (right).

Bulk Physical Properties

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For studying the thermal, electrical, magnetic, and mechanical properties of materials to advance the understanding of their structure-property relations and their performance across various applications.
Conductive Atomic Force Microscopy (AFM) of SRAM transistors (left); Magnetic hysteresis loops of Ni nanowires measured by an Alternating Gradient Magnetometer (AGM) (right).

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