NMC Leadership Team

Prof. Goh is the Executive Director of the National Metrology Centre at A*STAR.  Before this appointment, he was Deputy Executive Director of the Institute of Materials Research and Engineering at A*STAR and had held appointments such as Director of the Strategic Research Office and also Head of the Ceramics Materials department. Prof. Goh is the Covering Focal Point for the Sub Committee on Materials Science and Technology that is part of the ASEAN Committee on Science, Technology and Innovation.  He has also held an adjunct position in the Materials Science and Engineering department at the Nanyang Technological University since 2005.

In 2017 to 2019, Prof. Goh held a concurrent appointment as Director of Special Projects in the Science and Engineering Research Council, A*STAR, where he scoped future R&D programmes and also oversaw electrification of transport and related matters in the Urban and GreenTech Office.  He also represented A*STAR on various working committees such as Land and Liveability, Smart Urban Habitat and the biennial MND Urban Sustainability R&D Congress. In addition, Prof. Goh is the founding chair of the Singapore Battery Consortium.

In the years before taking up management responsibilities, Prof. Goh led R&D projects under the 1st and 2nd Joint A*STAR-MND Green Building Thematic Strategic Research Programmes and also served as the Programme Manager for the 2nd programme.  He also initiated and led research collaborations with overseas institutions such as Tohoku University, University College London and the University of California, Santa Barbara. His research focused on the deposition of functional and electroceramic films and nanostructures which can be utilised in self-cleaning, heat reflection and also electrochemical applications.  He has delivered over 30 invited lectures and has served on the Scientific Advisory Committees of international conferences in Asia and Europe.  He is an inventor of several Singapore, PCT, Japan and US patent applications. 

Prof. Goh graduated with a Bachelor of Engineering (1st Class Honours) and Master of Engineering from the Department of Mechanical Engineering at the National University of Singapore and obtained his Doctor of Philosophy from the Department of Materials Science and Engineering at the University of California at Santa Barbara on an IMRE Fellowship. Prof. Goh’s doctoral studies focused on developing a new, low temperature method for forming films of electronic ceramics while his master degree research investigated the fabrication of ceramic cutting tools.

Dr. KOH was the Programme Director/Principal Research Scientist at Energy Research Institute @ Nanyang Technological University (NTU) leading the national technology consortium, Smart Grid and Power Electronics Consortium Singapore, translating Institutes of Higher Learning (IHLs) intellectual properties and know-how to industries for economically viable commercialization solutions. In addition, he has curated the Standards Development Organisation at NTU in partnership with Enterprise Singapore and contributed as one of the steering committee members. He has several patents and technological disclosures in the power and energy domain.

Dr. KOH has been supervising post-graduate students in the sustainable smart city domain. The Singapore University of Social Sciences has awarded him a five-year Lecturer Service Award for serving as an Adjunct Professor. He has lectured post-graduate students as an Adjunct Faculty with Newcastle University in Singapore.

Before joining the IHLs, he held several managerial positions in multi-national companies and small & medium enterprises with expertise in industrial automation.

He has graduated with a Bachelor of Engineering (First Class) and Doctor of Philosophy from NTU and was awarded book prizes and scholarships.

Ms Leow Guat Hiong assumed the appointment as Deputy Director in the Administration Department at the National Metrology Centre in April 2018. As Deputy Director, Ms Leow leads the Administration Department to provide customer support to about 500 customers and to provide professional administrative support and office management to colleagues and supervisors for matters related to HR, Finance and IT to ensure all procedures comply with the Finance, HR and IT policies. She also plays a key role in implementing and maintaining an effective quality system according to the international standard on General Requirements for competence of Testing and Calibration Laboratories.

Ms Leow also plays the role as the key co-ordinator for NMC to be peer reviewed by the international experts so as to fulfil the International Committee for Weights and Measures (CIPM) Mutual Recognition Arrangement (MRA) requirements. Ms Leow was also one of the key personnel in handling Health, Safety and Environment activities to comply safety requirements to create safe workplace till Year 2014.
Ms Leow graduated with a Bachelor of Electrical and Electronics Engineering from the Nanyang Technological University and received the Long Service Medal National Day Awards in Year 2014.

Reshmy Pillay heads the Industry Development Office(IDO) at the National Metrology Centre, A*STAR.  Her main responsibility for her role in IDO is to lead the industry development activities including  planning & strategizing industrial development for research groups, including initiation and project management for industry projects, market & commercialize researchers’ R&D outcomes, industry, Legal contract & project agreement negotiation and Customer relationship management. She started her work at NMC in May 2019, and was in charge of the Research & Development Unit (RDU) where she was responsible to facilitate and coordinate research activities within NMC and in assisting the research institute in forging links with other research organizations. 

Reshmy started her career in the private sector in 1995, working in Hitachi Semiconductor for 12 years heading the quality functions covering incoming materials, in process QC, customer quality control, total quality management and failure analysis. 

Her first exposure to the Public sector was in Year 2007 at Exploit Technologies Pte.Ltd (current Enterprise Division of A*STAR), the commercialization arm of A*STAR, managing grants and project management for Flagship projects. She has successfully managed many projects funded under this umbrella. After transferring to the Institute of Materials Research and Engineering in year 2010, she was responsible for managing the SnFPC unit that covered 12 labs in characterization and fabrication, and during her tenure at IMRE improved cross training of staff members on multiple equipment, utilization rates for equipment and project management and services function for inter-RI and also to the industry. 

Prior to her current appointment, Reshmy has worked at the Singapore Institute of Technology, between 2014 and Apr 2019, during which she focused in assisting the Programme Directors in the Academic clusters in strategic planning and commencement of new Degree Programmes and was the main liaison between the University and public agencies, including MOE.

Reshmy graduated with a Bachelor of Technology Degree in Chemical Engineering (1st Class Honours) from the Department of Chemical Engineering at the University of Kerala, India and obtained her Master degree in Business Administration, specialising in Entrepreneurship, from the University of Louisville in year 2000. She was selected and sponsored by the Economic Development Board for the Talent Conversion programme to Semiconductor wafer fabrication and was trained in both the National University of Singapore and in wafer fabrication training facilities in Renesas Japan (duration: 1.5 years) for the same. Reshmy was sponsored for several commercialization related programmes by A*STAR and has successfully completed the 6-month long Commercial law programme sponsored by A*STAR held in Temasek Polytechnic.

Dr Ooi Thian Ngan assumed the appointment as Deputy Director in the Research Development Unit at the National Metrology Centre in January 2022. As Deputy Director, Dr Ooi works closely with the team on research road mapping and strategic planning to steer the R&D activities in the right direction. He also works with researchers to craft R&D proposals and oversees project management SOPs and policies.

He plays a key role in leading the effort in Additive Manufacturing (AM) as AM is identified as one of the strategic focus areas of the institute. He is also being tasked to guide and motivate researchers for R&D planning to develop measurement solutions in Quantum Metrology, Digitalisation in Metrology and Sustainability.

Dr Ooi graduated with a Bachelor of Applied Science and Master of Applied Science from the Department of Materials Engineering at the Nanyang Technological University and obtained his Doctor of Philosophy from the Department of Materials at Imperial College London. Dr Ooi’s doctoral studies focused on the isotope exchange studies of oxidation mechanisms in nickel-base superalloys using FIB-SIMS techniques.

Dr Tan Siew Leng is the Head of Metrology Office and also a Principal Metrologist in the length and dimensional laboratory of the Optical Metrology Cluster. The Metrology Office was created in 2021 and tasked to liaise with relevant international organisations to maximize the effectiveness of NMC’s participation.

Dr Tan has been very active and is well known in the international metrology community. She represented Singapore in the Consultative Committee for Length (CCL) and its working groups from 1998 to 2010 and was the Chair of the Technical Committee for Length (TCL) of the Asia Pacific Metrology Programme (APMP) from 2007 to 2011. She has many years of experience in technical assessment of metrology laboratories and has conducted many intra/inter-Regional Metrology Organisation (RMO) calibration and measurement capability (CMC) reviews and on-site peer assessments for other national metrology institutes (NMIs) such as NMIA (Australia), NIM (China), SCL (Hong Kong), KIM-LIPI (Indonesia), NMIJ (Japan), NMISA (South Africa) and NIMT (Thailand). 

She has served as chair for technical sessions, co-chair for conference, member for programme/scientific committee for abstract/paper review and invited speaker both locally and internationally in Germany, Japan, Philippines, Switzerland and Taiwan. She is the author or co-author of over 20 articles. 

Dr Tan holds an Honours degree in Physics and a Master’s degree in the Management of Technology, both from the National University of Singapore; and a PhD (Eng) in Nanomechanics from the Tohoku University of Japan. She has more than 30 years of expertise in the length & dimensional metrology and headed the optical metrology for many years prior to her PhD studies in 2014. 

She has received the National Excellent Service Award, SPRING Singapore Individual & Group STAR awards, SAC-SINGLAS Gold and Distinguish Awards, APMP Technical Activity Award and Long Service Medal of the National Day Awards for her contributions in various areas.

Dr Chua is the Head and Principal Metrologist and leads the Electrical Metrology Cluster in the development and maintenance of national electrical measurement standards in the scope of electromagnetic spectrum to establish international equivalence for Singapore’s national measurement infrastructure. He is overseeing the SI units’ realisation and traceability dissemination of electromagnetic measurement units through calibration and measurement services to the industry. Working with a dedicated team, he leads the Cluster to undertake R&D to advance metrology and deliver measurement solutions, provide metrology training, consultancy, and proficiency testing to the industry. His research interests are in the field of dc and low frequency electrical metrology and his current work are mainly related to the primary standards of voltage and resistance, ac-dc transfer, and energy efficiency measurement systems, and has published and co-authored more than 58 technical papers. 

Dr Chua has been involved in metrology for more than 32 years since he joined the Measurement Standards Centre (the predecessor of NMC), the Singapore Institute of Standards and Industrial Research (SISIR), in 1990. He was involved in various national metrology infrastructure projects, such as SISIR’s Calibration and Measurement Centre, the UNDP/UNIDO’s project “Harmonization of Voltage Metrology in ASEAN Member Countries” that set up the first regional quantum based voltage primary standard in Singapore. He organised an Asian Productivity Organization (APO) funded review of Singapore’s national metrology programme and a MTI follow-up review on chemical metrology infrastructure needs in Singapore. He plays a key role in spearheading national electrical metrology capability development projects since 1990 and propel NMC’s electrical metrology Calibration and Measurement Capabilities (CMCs) to attain CIPM global metrology CIPM MRA acceptance in 2005. 

Dr Chua represents NMC at the Consultative Committee on Electricity and Magnetism (CCEM) and Asia Pacific Metrology Programme Technical Committee on Electricity and Magnetism (APMP TCEM). He was the inaugural Chairman of the TCEM from 1999 to 2002, Chairman of CCEM Regional Metrology Organisations (RMO) TCEM Chairs Group in 2005 and Working Group for RMO Coordination (CCEM-WGRMO) from 2007 to 2009. He was a member of APMP Executive Committee and Treasurer from 2007 to 2010 and was responsible for the liaison work for APMP in APEC’s Sub-Committee on Standards and Conformance (SCSC) and Specialist Regional Bodies (SRB). He received an APMP Award in 2013 for his contributions to APMP.  He has been invited to conduct peer assessments on electrical metrology capabilities for national metrology institutes and the International Bureau of Weights and Measures (BIPM) in support of the CIPM MRA requirements. He is actively involved in standardisation and conformance assessment work and is currently a member of the Singapore Standards Council’s  Electrical and Electronic Standards Committee (EESC) and IEC National Committee, and a registered Technical Assessor for the Singapore Accreditation Council Singapore Laboratory Accreditation Scheme (SAC-SINGLAS). He co-chaired the Technical Committee on Thermal Imager from 2003 to 2011 that developed the world’s first Technical Reference for human body temperature screening using a thermal imager. He was a member of the Council Committee on Laboratory Accreditation (SAC CCLA) from 2006 to 2012, Chairman of SAC SINGLAS Calibration and Measurement Technical Committee (CMTC) from 2003 to 2006. He received a Distinguished Technical Assessor Award in 2005 and Quality & Standard Merit Award from SPRING in 2010. 

Dr Chua graduated with a BSEE (High Honor) from University of Arkansas, USA, in 1987, MSEE from Ohio State University, USA, in 1989, and Phd in Manufacturing and Engineering Systems from Brunel University, UK in 1998 under a SISIR’s scholarship, attached to the National Physical Laboratory, UK undertaking a project to develop ac resistance standard based on the quantum Hall effect.

Mr Chua Hock Ann is the Head of Mechanical Metrology Cluster 1 of the National Metrology Centre. As Cluster Head, Mr Chua Hock Ann leads the acoustic, gas, and temperature metrology laboratories in the planning, development and implementation of the national metrology programme, transfer of measurement units and knowhows to the industry, and measurement R&D in the focus areas of Metrology in Digital Transformation and Sustainability.

Mr Chua Hock Ann was also appointed as the Co-Convenor of two standardisation Working Groups administered under Enterprise Singapore, in which he plays a key role in spearheading the development and publication of Singapore Standard SS582 “Thermal imagers for human temperature screening” and Technical Reference TR56 “LNG bunkering specifications”, both of which were revised and published in 2020.  Currently, he also serves as a member of the Technical Committee for Bunkering (Gaseous and Cryogenic Fuels).

Prior to his current appointment, Mr Chua Hock Ann served as the Head of various metrology labs, including electromagnetic, time and frequency, and mechanical, managing the development, maintenance and dissemination of measurement standards, and transfer of measurement knowhow to the industry. He also served as the technical assessor in the accreditation of calibration laboratories under the Singapore Accreditation Council-Singapore Laboratory Accreditation Scheme (SAC-SINGLAS) and formerly served the Council Committee for Laboratory Accreditation of SAC.

Mr Chua Hock Ann graduated with a Bachelor of Applied Science (Honours) from the Department of Electrical Engineering at the University of Windsor, Canada, and obtained his Master of Science degree with Distinction in Industry Measurement System at the Brunel University, UK, and was awarded the Institute of Quality Assurance Prize for submitting the best project on quality.

Dr Shan Yueyan assumed the appointment as Head in the OM at the NMC from July 2020. As Head, Dr Shan leads and oversees the OM for Optical Metrology Lab (OL) and Length and Dimensional Metrology Lab (LL) in the development and implementation of R&D strategies, as well as the calibration and measurement capabilities and services. Dr Shan also holds a concurrent appointment as Principal Metrologist in the RF & microwave and time & frequency areas since 2012, where she played a key role in spearheading of measurement standards.

Dr Shan contributed to the establishment of national time and frequency standard and the setup and development of the national microwave measurement standards and calibration systems. Since 1998 joined NMC she published 95 papers related to RF & microwave metrology and time & frequency metrology. As a recognised metrologist and expert, she was invited to peer assessment of other National Metrology Institute’s calibration and measurement capabilities (CMCs), such as SCL-Hong Kong, NIM-China, CMS/ITRI-Taiwan, NMIJ-Japan, and NMIT-Thailand. She was appointed as APMP (Asia Pacific Metrology Programme) TCEM RF CMC review Chair 2011-2015, and Sub-committee chair for RF and microwave from 2015-2018. She was invited to review international journals and conference papers and as section chairs for conferences. 

Dr Shan graduated with Bachelor and Masters of Electrical and Electronic Engineering from Beijing Institute of Technology and Nanyang Technological University.  Her PhD was obtained from The Hong Kong Polytechnic University in the Manufacturing Engineering Department.

Dr Meng Yusong received the B.Eng. (Hons.) and Ph.D. degrees in electrical and electronic engineering from Nanyang Technological University, Singapore, in 2005 and 2010, respectively. 

He joined the Agency for Science, Technology and Research (A*STAR), Singapore in 2009, where he is currently a Senior Scientist and Assistant Head of the Electrical Metrology Cluster at A*STAR’s National Metrology Centre and responsible for operational and R&D activities in high-frequency metrology area including RF & Microwave and Time & Frequency. From 2012 to 2014, He was seconded to Psiber Data Pte. Ltd., Singapore, where he was involved in metrological development and assurance of a handheld cable analyser, under a national Technology for Enterprise Capability Upgrading (T-Up) scheme of Singapore. 

Concurrently, he serves as a Technical Assessor for the Singapore Accreditation Council-Singapore Laboratory Accreditation Scheme (SAC-SINGLAS) in the field of high-frequency metrology. His research interests include electromagnetic metrology, electromagnetic measurements and standards, and electromagnetic-wave propagations where he has authored/co-authored more than 120 papers. Currently he is focusing on the development of next generation optical atomic clock and its applications.

Dr Meng is the elected Chair of the Asia Pacific Metrology Programme (APMP) Technical Committee on Electricity and Magnetism (TCEM) from 2021 to 2024. He was a recipient of the APMP Iizuka Young Metrologist Award in 2017 and the T-Up Excellence Award in 2015. He also received a Best Student Paper Award (First Prize) in 2017 as co-author, and SAC Assessor Award (Silver and Bronze) in 2019 and 2016 respectively.

Dr. Cui Shan assumed the role as the Assistant Head of Mechanical Metrology 1 Cluster at the National Metrology Centre in August 2021. Dr. Cui assists the respective Cluster Head in strategizing, planning and managing of NMC’s functions in establishing and disseminating traceability, maintaining national reference standards, addressing industry and national needs and carrying out measurement R&D in Acoustics & Vibration, Gas Analysis and Temperature & Humidity areas.

Dr. Cui co-leads one of NMC’s R&D focus areas in RIE 2025 on Digitalisation of Metrology. She is a Steering Group Member of the Asia Pacific Metrology Programme  Focus Group on Digital Transformation in Metrology. She is representing A*STAR as a Technical Committee Member in CoolestSG, a national cooling technology consortium in Singapore. Dr. Cui is also a technical assessor in the area of acoustics and vibration calibration for the Singapore Accreditation Council. She received the Singapore Accreditation Council Assessor Award, Gold in Nov 2020.

Dr. Cui graduated with a Bachelor of Engineering (1st Class Honours) and obtained her Doctor of Philosophy from the School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore. 

Dr. Yu Shengkai is the Assistant Head of Optical Metrology Cluster, National Metrology Centre (NMC) at A*STAR. He is also a Senior Scientist focusing on dimensional metrology, metrology for digital transformation, and metrology for additive manufacturing. Currently he is a member of the Technical Committee for Nanotechnology of Singapore Chemical Industry Council (SCIC), a member of ASTM Committee F42 on Additive Manufacturing Technologies, a member of APMP focus group on Digital Transformation in Metrology, and also an authorized technical assessor for the Singapore Accreditation Council - Singapore Laboratory Accreditation Scheme (SAC-SINGLAS). 

Before joining NMC in 2017, Dr. Yu had 17 years’ R&D experience on data storage systems and devices, especially on ultra-thin film, and nano-scaled interface system. His research areas include surface and thin film characterization, nano-mechanics and tribology, aerodynamics, heat transfer and thermal analysis, and multidisciplinary design optimization, etc.

Dr. Yu graduated with a Bachelor of Science degree and Master of Engineering degree from Shanghai Jiao Tong University, China, and obtained his PhD from School of Civil and Environmental Engineering at Nanyang Technological university, Singapore.