RESEARCH IN SIMTECH

INTRODUCTION

Diagnosis and Measurement Unit (DMU) develops core competences in advanced material characterisation and dimensional metrology for R&D in advanced manufacturing technologies. With interdisciplinary expertise and extensive range of advanced analytical equipment, DMU readily provides consultations, material insights and engineering solutions for the industry.

Focus Research Areas 

• Advanced Material Characterisation
• Dimensional Metrology

KEY FACILITIES

• Field Emission Scanning Electron Microscope with Energy Dispersive X-ray Spectroscopy (FE-SEM EDS)
  
• Focused Ion Beam (FIB) with Electron Backscattered Diffraction (EBSD)
  
• X-ray Photoelectron Spectroscopy (XPS)
  
• High Resolution Microfocus and Nanofocus X-ray CT System
  
• Fourier Transform Infrared Spectroscopy (FTIR)
  
• Raman Microscope
  
• UV-Vis-NIR Spectrophotometer
  
• Spectroscopic Ellipsometer
  
• Differential Scanning Calorimeter (DSC)
  
• Thermogravimetric Analyzer (TGA)
  
• Dynamic Mechanical Analyzer (DMA)
  
• Thermomechanical Analyzer (TMA)
  
• Simultaneous Thermal Analyzer (STA)
  
• Rotational Rheometer
  
• X-ray Diffractometer (XRD)
  
• High Accuracy and High-Speed Coordinate Measuring Machine (CMM)
  
• Optical 3D Surface Metrology System
  
• Optical Interferometer
  
• Stylus Profilometer
  
• Multi-functional Atomic Force Microscope (AFM)
  
• Universal Testing Machine (UTM)
• Rockwell Hardness Tester
  
• Micro-Vickers Hardness Tester
  
• Nano-Indentation with High Temperature Capabilities
  
• Metallurgical Microscopes with Image Analysis
  
• Metallurgical Specimen Preparation System
  
• Environmental Test Chambers: Temperature, Humidity
  

KEY TECHNOLOGIES

• Advanced Material Characterisation
• Dimensional Measurement
  
• X-ray Analysis and High-resolution X-ray CT Inspection
  
• Failure Analysis